Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

Applied Physics Letters

Volumn 92, Issue 22, 2008, Pages

  Kang, Hyon Chol ^a,b   Yan, Hanfei ^a,c   Winarski, Robert P ^a   Holt, Martin V ^a   Maser, Jörg ^a   Liu, Chian ^a   Conley, Ray ^a   Vogt, Stefan ^a   MacRander, Albert T ^a   Stephenson, G Brian ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMERICAN INSTITUTE OF PHYSICS (AIP); HARD X RAY FOCUSING; HARD X-RAYS (HX); LINE FOCUSSING; MULTILAYER (ML); PREDICTED PERFORMANCE;

LENSES; OPTICAL INSTRUMENTS; X RAYS;

MULTILAYERS;

EID: 44849137773     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2912503     Document Type: Article

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