Hard x-ray nanobeam characterization by coherent diffraction microscopy

Applied Physics Letters

Volumn 96, Issue 9, 2010, Pages

  Schropp, A ^a   Boye, P ^a   Feldkamp, J M ^a   Hoppe, R ^a   Patommel, J ^a   Samberg, D ^a   Stephan, S ^a   Giewekemeyer, K ^b   Wilke, R N ^b   Salditt, T ^b   Gulden, J ^c   Mancuso, A P ^c   Vartanyants, I A ^c   Weckert, E ^c   Schoder S ^d   Burghammer, M ^d   Schroer, C G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c DESY   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT DIFFRACTION; COHERENT DIFFRACTION IMAGING; COMPLEX WAVES; DYNAMIC RANGE; HARD X RAY; HIGH RESOLUTION IMAGE; HIGH SPATIAL RESOLUTION; NANO-FOCUS; PRIOR KNOWLEDGE; SCANNING X-RAY MICROSCOPES; TEST OBJECT;

HOLOGRAPHIC INTERFEROMETRY; NANOWIRES; SCANNING ELECTRON MICROSCOPY;

X RAY MICROSCOPES;

EID: 77949347647     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3332591     Document Type: Article

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