Hard X-ray nanoprobe at beamline P06 at PETRA III

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 616, Issue 2-3, 2010, Pages 93-97

  Schroer, Christian G ^a   Boye, Pit ^a   Feldkamp, Jan M ^a   Patommel, Jens ^a   Samberg, Dirk ^a   Schropp, Andreas ^a   Schwab, Andreas ^a   Stephan, Sandra ^a   Falkenberg, Gerald ^b   Wellenreuther, Gerd ^b   Reimers, Nadja ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b DESY   (Germany)

Author keywords

Hard X ray nanoprobe; Hard X ray scanning microscope; Nanofocusing lenses; Refractive X ray lenses

Indexed keywords

BEAM LINES; DIFFRACTION CONTRAST; FOCUSING OPTICS; GERMANY; HARD X RAY; NANOFOCUSING LENS; NANOFOCUSING REFRACTIVE X-RAY LENS; OPTICAL SCHEME; PETRA III; REFRACTIVE X-RAY LENS; SCANNING TOMOGRAPHY; SPATIAL RESOLUTION; STRUCTURAL INFORMATION; SYNCHROTRON RADIATION SOURCE; TWO DIMENSIONAL MAPPING; TWO STAGE; X RAY FLUORESCENCE;

MICROSCOPES; NANOPROBES; OPTICAL INSTRUMENT LENSES; QUANTUM OPTICS; SCANNING; TOMOGRAPHY;

X RAYS;

EID: 77950843932     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.10.094     Document Type: Article

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