Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

Optics Express

Volumn 19, Issue 17, 2011, Pages 16324-16329

  Hönig, Susanne ^a   Hoppe, Robert ^a   Patommel, Jens ^a   Schropp, Andreas ^a   Stephan, Sandra ^a   Schöder, Sebastian ^b   Burghammer, Manfred ^b   Schroer, Christian G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT DIFFRACTION; COHERENT X-RAYS; COMPLEX WAVES; HARD X RAY; HIGH RESOLUTION IMAGE; LATERAL SIZES; OPTICAL AXIS; OPTICAL CHARACTERIZATION; SPATIAL RESOLUTION; WAVEFIELDS;

NANOWIRES;

EID: 80051745498     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.016324     Document Type: Article

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