Nanometer linear focusing of hard X rays by a multilayer laue lens

Physical Review Letters

Volumn 96, Issue 12, 2006, Pages

  Kang, H C ^a   Maser, J ^a   Stephenson, G B ^a   Liu, C ^a   Conley, R ^a   MacRander, A T ^a   Vogt, S ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LAUE DIFFRACTION GEOMETRY; MULTILAYER LAUE LENS;

CRYSTALS; DIFFRACTION; MULTILAYERS; OPTICS; SYNCHROTRON RADIATION; X RAYS;

LENSES;

EID: 33645279539     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.127401     Document Type: Article

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