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Volumn 98, Issue 11, 2011, Pages

Measurement of hard x-ray lens wavefront aberrations using phase retrieval

Author keywords

[No Author keywords available]

Indexed keywords

BEAM FOCUS; BEAM PATH; FAR-FIELD INTENSITY MEASUREMENTS; HARD X RAY; KINOFORM LENS; MANUFACTURING ERRORS; NUMERICAL SIMULATION; PHASE RETRIEVAL; ROOT MEAN SQUARED ERRORS; WAVEFRONT ABERRATIONS;

EID: 79952927352     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3558914     Document Type: Article
Times cited : (39)

References (14)
  • 1
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    • D. Malacara, Optical Shop Testing (Wiley, New Jersey, 2007). 10.1002/9780470135976
    • (2007) Optical Shop Testing
    • Malacara, D.1
  • 3
    • 17944362788 scopus 로고    scopus 로고
    • X-ray wavefront analysis and optics characterization with a grating interferometer
    • DOI 10.1063/1.1857066, 054101
    • T. Weitkamp, B. Nöhammer, A. Diaz, C. David, and E. Ziegler, Appl. Phys. Lett. 0003-6951 86, 054101 (2005). 10.1063/1.1857066 (Pubitemid 40661707)
    • (2005) Applied Physics Letters , vol.86 , Issue.5 , pp. 1-3
    • Weitkamp, T.1    Nohammer, B.2    Diaz, A.3    David, C.4    Ziegler, E.5
  • 4
    • 4043119629 scopus 로고    scopus 로고
    • 0031-9007, 10.1103/PhysRevLett.93.023903
    • H. M. L. Faulkner and J. M. Rodenburg, Phys. Rev. Lett. 0031-9007 93, 023903 (2004). 10.1103/PhysRevLett.93.023903
    • (2004) Phys. Rev. Lett. , vol.93 , pp. 023903
    • Faulkner, H.M.L.1    Rodenburg, J.M.2
  • 13
    • 43849104622 scopus 로고    scopus 로고
    • Phase retrieval with transverse translation diversity: A nonlinear optimization approach
    • DOI 10.1364/OE.16.007264
    • M. Guizar-Sicairos and J. R. Fienup, Opt. Express 1094-4087 16, 7264 (2008). 10.1364/OE.16.007264 (Pubitemid 351697413)
    • (2008) Optics Express , vol.16 , Issue.10 , pp. 7264-7278
    • Guizar-Sicairos, M.1    Fienup, J.R.2
  • 14
    • 84975542020 scopus 로고
    • 0003-6935, 10.1364/AO.13.002775
    • A. E. Siegman and E. A. Sziklas, Appl. Opt. 0003-6935 13, 2775 (1974). 10.1364/AO.13.002775
    • (1974) Appl. Opt. , vol.13 , pp. 2775
    • Siegman, A.E.1    Sziklas, E.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.