Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3360-3362

  Schroer, C G ^a   Kuhlmann, M ^a   Gunzler T F ^a   Lengeler, B ^a   Richwin, M ^b   Griesebock, B ^b   Lutzenkirchen Hecht D ^b   Frahm, R ^b   Ziegler, E ^c   Mashayekhi, A ^d   Haeffner, D R ^d   Grunwaldt, J D ^e   Baiker, A ^e  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; DATA ACQUISITION; MONOCHROMATORS; REFRACTION; SPECTRUM ANALYSIS; TOMOGRAPHY;

OXIDATION STATES;

X RAY SPECTROSCOPY;

EID: 0038317934     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1573352     Document Type: Article

References (23)

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20. 2 due to chromatic aberration in the XANES energy range is smaller than the depth of focus. Therefore, the lateral beam size (10 μm horizontally) was nearly constant.
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