Hard X-ray scanning microscopy with coherent diffraction contrast

AIP Conference Proceedings

Volumn 1365, Issue , 2010, Pages 227-230

  Schroer, C G ^a   Schropp, A ^a   Boye, P ^a   Hoppe, R ^a   Patommel, J ^a   Honig S ^a   Samberg, D ^a   Stephan, S ^a   Schoder S ^b   Burghammer, M ^b   Wellenreuther, G ^c   Falkenberg, G ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c DESY   (Germany)

Author keywords

coherent diffraction imaging; Hard x ray microscopy; ptychography; refractive x ray lenses

Indexed keywords

EID: 80053331509     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3625345     Document Type: Conference Paper

References (22)

1. C. G. Schroer et al., Appl. Phys. Lett. 82, 1485 (2003).
2. C. G. Schroer et al., Appl. Phys. Lett. 87, 124103 (2005).
3. C. G. Schroer et al., Nucl. Instr. Meth. A 616, 93 (2010).
4. A. S. Simionovici et al., IEEE Trans. Nucl. Sci. 47, 2736 (2000).
5. C. G. Schroer, Appl. Phys. Lett. 79, 1912 (2001).
6. C. G. Schroer et al., Appl. Phys. Lett. 82, 3360 (2003).
7. C. G. Schroer, M. Kuhlmann, S. V. Roth et al., Appl. Phys. Lett. 88, 164102 (2006).
8. M. Kuhlmann et al., Langmuir Lett. 25, 7241 (2009).
9. J. R. Fienup, Appl. Opt. 21, 2758 (1982).
10. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature 400, 342 (1999).
11. D. Shapiro et al., P. Natl. Acad. Sci. USA 102, 15343 (2005).
12. H. N. Chapman et al., J. Opt. Soc. Am. A 23, 1179 (2006).
13. H. N. Chapman et al., Nature Physics 2, 839 (2006).
14. A. Schropp and C. G. Schroer, New J. Physics 12, 035016 (2010).
15. C. G. Schroer et al., Phys. Rev. Lett. 101, 090801 (2008).
16. R. Hegerl and W. Hoppe, Ber. Bunsen-Ges. Phys. Chem. 74, 1148 (1970).
17. J. M. Rodenburg and H. M. L. Faulkner, Appl. Phys. Lett. 85, 4795 (2004).
18. J. M. Rodenburg et al., Phys. Rev. Lett. 98, 034801 (2007).
19. P. Thibault et al., Science 321, 379 (2008).
20. A. Schropp et al., Appl. Phys. Lett. 96, 091102 (2010).
21. C. G. Schroer, and B. Lengeler, Phys. Rev. Lett. 94, 054802 (2005).
22. A. M. Maiden and J. M. Rodenburg, Ultramicroscopy 109, 1256 (2009).