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Applied Physics Letters

Volumn 88, Issue 16, 2006, Pages

Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering

(7) Schroer, C G a,d Kuhlmann, M a Roth, S V a Gehrke, R a Stribeck, N b Almendarez Camarillo, A b Lengeler, B c

a DESY (Germany)

b UNIVERSITY OF HAMBURG (Germany)

c RWTH AACHEN UNIVERSITY (Germany)

d DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; INJECTION MOLDING; SCATTERING; SIGNAL RECONSTRUCTION; TOMOGRAPHY;

ROTATIONAL SYMMETRY; SCANNING MICROTOMOGRAPHY; SMALL-ANGLE X-RAY SCATTERING; TOMOGRAPHIC ROTATION AXIS;

NANOSTRUCTURED MATERIALS;

EID: 33646178799 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2196062 Document Type: Article

Times cited : (106)

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