Hard x-ray nanoprobe based on refractive x-ray lenses

Applied Physics Letters

Volumn 87, Issue 12, 2005, Pages 1-3

  Schroer, C G ^a   Kurapova, O ^b   Patommel, J ^b   Boye, P ^b   Feldkamp, J ^b   Lengeler, B ^b   Burghammer, M ^c   Riekel, C ^c   Vincze, L ^d   Van Der Hart, A ^e   Kuchler M ^f  

^a DESY   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d GHENT UNIVERSITY   (Belgium)

^e FORSCHUNGSZENTRUM JÜLICH   (Germany)

^f FRAUNHOFER IZM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; FLUORESCENCE; LENSES; X RAY ANALYSIS;

BEAM SIZE; TOMOGRAPHIC SCANNING; X-RAY LENSES;

NANOSTRUCTURED MATERIALS;

EID: 28344441583     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2053350     Document Type: Article

References (13)

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