In situ nanomechanical testing in focused ion beam and scanning electron microscopes

Review of Scientific Instruments

Volumn 82, Issue 6, 2011, Pages

  Gianola, D S ^a,b   Sedlmayr, A ^b   Mnig, R ^b   Volkert, C A ^c   Major, R C ^d   Cyrankowski, E ^d   Asif, S A S ^d   Warren, O L ^d   Kraft, O ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF GÖTTINGEN   (Germany)

^d Bruker Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL IMAGE CORRELATIONS; DISPLACEMENT MEASUREMENTS; DUAL-BEAM; ELECTRON IMAGES; HIGH FIDELITY; IN-SITU; IN-VACUUM; MECHANICAL BEHAVIOR; MECHANICAL TESTING METHODS; METALLIC NANOWIRES; NANO-POROUS; NANO-SCALE MATERIALS; NANOMECHANICAL TESTING; SCANNING ELECTRON MICROSCOPE; SINGLE-CRYSTALLINE; SIZE EFFECTS;

BEAM PLASMA INTERACTIONS; ELECTRON MICROSCOPES; ELECTRON OPTICS; ELECTRONS; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; MATERIALS TESTING; MECHANICAL ENGINEERING; NANOWIRES; PLATINUM; SCANNING ELECTRON MICROSCOPY; STRAIN MEASUREMENT;

TENSILE TESTING;

EID: 79960185136     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3595423     Document Type: Article

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