Development of patterns for digital image correlation measurements at reduced length scales

Experimental Mechanics

Volumn 47, Issue 1, 2007, Pages 63-77

  Scrivens, W A ^a   Luo, Y ^a   Sutton, M A ^b   Collette, S A ^b   Myrick, M L ^a   Miney, P ^a   Colavita, P E ^a   Reynolds, A P ^b   Li, X ^b  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

^b University of South Carolina   (United States)

Author keywords

Digital image correlation; Electron microscopy; Metallicthin film random patterning; Microscale; Nanoscale

Indexed keywords

DEFORMATION MEASUREMENTS; DIGITAL IMAGE CORRELATION; MAGNIFICATION IMAGING SYSTEMS; METALLIC THIN FILM RANDOM PATTERNING;

COMPUTER SIMULATION; DEFORMATION; METALLIC FILMS; MORPHOLOGY; PHOTOLITHOGRAPHY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET RADIATION;

OPTICAL CORRELATION;

COMPUTER SIMULATION; DEFORMATION; METALLIC FILMS; MORPHOLOGY; OPTICAL CORRELATION; PHOTOLITHOGRAPHY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET RADIATION;

EID: 33947417163     PISSN: 00144851     EISSN: 17412765     Source Type: Journal    
DOI: 10.1007/s11340-006-5869-y     Document Type: Article

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