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Volumn 58, Issue 1, 2011, Pages 26-32

Nanowire to single-electron transistor transition in trigate SOI MOSFETs

Author keywords

3 D device modeling; low temperature; low dimensional structures; quantum transport; silicon nanowire transistor; tunnel barrier field effect transistor (FET)

Indexed keywords

DEVICE MODELING; LOW TEMPERATURES; LOW-DIMENSIONAL STRUCTURES; QUANTUM TRANSPORT; SILICON NANOWIRE TRANSISTOR;

EID: 78650921901     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2010.2084390     Document Type: Article
Times cited : (9)

References (31)
  • 1
    • 2342648815 scopus 로고    scopus 로고
    • A dual-gate-controlled single-electron transistor using self-aligned polysilicon sidewall spacer gates on silicon-on-insulator nanowire
    • Mar.
    • S. F. Hu, Y. C. Wu, C. L. Sung, C. Y. Chang, and T. Y. Huang, "A dual-gate-controlled single-electron transistor using self-aligned polysilicon sidewall spacer gates on silicon-on-insulator nanowire," IEEE Trans. Nanotechnol., vol. 3, no. 1, pp. 93-97, Mar. 2004.
    • (2004) IEEE Trans. Nanotechnol. , vol.3 , Issue.1 , pp. 93-97
    • Hu, S.F.1    Wu, Y.C.2    Sung, C.L.3    Chang, C.Y.4    Huang, T.Y.5
  • 2
    • 0038346863 scopus 로고    scopus 로고
    • Tunneling barrier structures in room-temperature operating silicon single-electron and single-hole transistors
    • M. Saitoh, H. Majima, and T. Hiramoto, "Tunneling barrier structures in room-temperature operating silicon single-electron and single-hole transistors," Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes, vol. 42, no. 4B, pp. 2426-2428, 2003.
    • (2003) Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes , vol.42 , Issue.4 B , pp. 2426-2428
    • Saitoh, M.1    Majima, H.2    Hiramoto, T.3
  • 3
    • 33644612598 scopus 로고    scopus 로고
    • An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature
    • Mar.
    • W. Lee, P. Su, H. Y. Chen, C. Y. Chang, K. W. Su, S. Liu, and F. L. Yang, "An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature," IEEE Electron Device Lett., vol. 27, no. 3, pp. 182-184, Mar. 2006.
    • (2006) IEEE Electron Device Lett. , vol.27 , Issue.3 , pp. 182-184
    • Lee, W.1    Su, P.2    Chen, H.Y.3    Chang, C.Y.4    Su, K.W.5    Liu, S.6    Yang, F.L.7
  • 5
    • 34547664815 scopus 로고    scopus 로고
    • Control of full width at half maximum of Coulomb oscillation in silicon single-hole transistors at room temperature
    • Jul.
    • K. Miyaji and T. Hiramoto, "Control of full width at half maximum of Coulomb oscillation in silicon single-hole transistors at room temperature," Appl. Phys. Lett., vol. 91, no. 5, pp. 053509-1-053509-3, Jul. 2007.
    • (2007) Appl. Phys. Lett. , vol.91 , Issue.5 , pp. 0535091-0535093
    • Miyaji, K.1    Hiramoto, T.2
  • 6
    • 65249088989 scopus 로고    scopus 로고
    • Single-electron effects in non-overlappedmultiple-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    • Feb.
    • W. Lee and P. Su, "Single-electron effects in non- overlappedmultiple-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors," Nanotechnology, vol. 20, no. 6, p. 065202, Feb. 2009.
    • (2009) Nanotechnology , vol.20 , Issue.6 , pp. 065202
    • Lee, W.1    Su, P.2
  • 7
    • 78649626640 scopus 로고    scopus 로고
    • A new F(ast)-CMS NEGF algorithm for efficient 3D simulations of switching characteristics
    • A. Afzalian, N. Dehdashti, C.-W. Lee, R. Yan, I. Ferain, P. Razavi, and J. P. Colinge, "A new F(ast)-CMS NEGF algorithm for efficient 3D simulations of switching characteristics," J. Comput. Electron., vol. 8, no. 3/4, pp. 287-306, 2009.
    • (2009) J. Comput. Electron. , vol.8 , Issue.3-4 , pp. 287-306
    • Afzalian, A.1    Dehdashti, N.2    Lee, C.-W.3    Yan, R.4    Ferain, I.5    Razavi, P.6    Colinge, J.P.7
  • 8
    • 3242685133 scopus 로고    scopus 로고
    • Singleelectron transistors fabricated with sidewall spacer patterning
    • Sep.
    • B. G. Park, D. H. Kim, K. R. Kim, K. W. Song, and J. D. Lee, "Singleelectron transistors fabricated with sidewall spacer patterning," Superlatt. Microstruct., vol. 34, no. 3-6, pp. 231-239, Sep. 2003.
    • (2003) Superlatt. Microstruct. , vol.34 , Issue.3-6 , pp. 231-239
    • Park, B.G.1    Kim, D.H.2    Kim, K.R.3    Song, K.W.4    Lee, J.D.5
  • 9
    • 3042803437 scopus 로고    scopus 로고
    • Silicon single electron transistors with SOI and MOSFET structures: The role of access resistances
    • Dec.
    • X. Jehl, M. Sanquer, G. Bertrand, G. Guegan, S. Deleonibus, and D. Fraboulet, "Silicon single electron transistors with SOI and MOSFET structures: The role of access resistances," IEEE Trans. Nanotechnol., vol. 2, no. 4, pp. 308-313, Dec. 2003.
    • (2003) IEEE Trans. Nanotechnol. , vol.2 , Issue.4 , pp. 308-313
    • Jehl, X.1    Sanquer, M.2    Bertrand, G.3    Guegan, G.4    Deleonibus, S.5    Fraboulet, D.6
  • 12
    • 33748462725 scopus 로고    scopus 로고
    • Electrostatically gated Si devices: Coulomb blockade and barrier capacitance
    • Jul.
    • N. M. Zimmerman, A. Fujiwara, H. Inokawa, and Y. Takahashi, "Electrostatically gated Si devices: Coulomb blockade and barrier capacitance," Appl. Phys. Lett., vol. 89, no. 5, pp. 052102-1-052102-3, Jul. 2006.
    • (2006) Appl. Phys. Lett. , vol.89 , Issue.5 , pp. 0521021-0521023
    • Zimmerman, N.M.1    Fujiwara, A.2    Inokawa, H.3    Takahashi, Y.4
  • 13
    • 0035484738 scopus 로고    scopus 로고
    • Modelling of structural and threshold voltage characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime
    • Oct.
    • G. J. Evans, H. Mizuta, and H. Ahmed, "Modelling of structural and threshold voltage characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime," Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes, vol. 40, no. 10, pp. 5837-5840, Oct. 2001.
    • (2001) Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes , vol.40 , Issue.10 , pp. 5837-5840
    • Evans, G.J.1    Mizuta, H.2    Ahmed, H.3
  • 15
    • 33845426952 scopus 로고    scopus 로고
    • Two-dimensional quantum mechanical modeling of nanotransistors
    • Feb.
    • M. P. Anantram, A. Svizhenko, and A. Martinez, "Two-dimensional quantum mechanical modeling of nanotransistors," J. Appl. Phys., vol. 91, no. 4, pp. 2343-2354, Feb. 2002.
    • (2002) J. Appl. Phys. , vol.91 , Issue.4 , pp. 2343-2354
    • Anantram, M.P.1    Svizhenko, A.2    Martinez, A.3
  • 16
    • 4344606224 scopus 로고    scopus 로고
    • A three-dimensional quantum simulation of silicon nanowire transistors with the effective-mass approximation
    • Aug.
    • J. Wang, E. Polizzi, and M. Lundstrom, "A three-dimensional quantum simulation of silicon nanowire transistors with the effective-mass approximation," J. Appl. Phys., vol. 96, no. 4, pp. 2192-2203, Aug. 2004.
    • (2004) J. Appl. Phys. , vol.96 , Issue.4 , pp. 2192-2203
    • Wang, J.1    Polizzi, E.2    Lundstrom, M.3
  • 17
    • 38849209164 scopus 로고    scopus 로고
    • A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in nano-MOSFETs
    • Sep.
    • A. Martinez, M. Bescond, J. R. Barker, A. Svizhenko, M. P. Anantram, C. Millar, and A. Asenov, "A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in nano-MOSFETs," IEEE Trans. Electron Devices, vol. 54, no. 9, pp. 2213-2222, Sep. 2007.
    • (2007) IEEE Trans. Electron Devices , vol.54 , Issue.9 , pp. 2213-2222
    • Martinez, A.1    Bescond, M.2    Barker, J.R.3    Svizhenko, A.4    Anantram, M.P.5    Millar, C.6    Asenov, A.7
  • 19
    • 77955883760 scopus 로고    scopus 로고
    • Effect of intravalley acoustic phonon scattering on quantum transport in multigate silicon nanowire metal-oxide-semiconductor field-effect transistors
    • Aug.
    • N. D. Akhavan, A. Afzalian, C. W. Lee, R. Yan, I. Ferain, P. Razavi, R. Yu, G. Fagas, and J. P. Colinge, "Effect of intravalley acoustic phonon scattering on quantum transport in multigate silicon nanowire metal-oxide-semiconductor field-effect transistors," J. Appl. Phys., vol. 108, no. 3, p. 034 510, Aug. 2010.
    • (2010) J. Appl. Phys. , vol.108 , Issue.3 , pp. 034510
    • Akhavan, N.D.1    Afzalian, A.2    Lee, C.W.3    Yan, R.4    Ferain, I.5    Razavi, P.6    Yu, R.7    Fagas, G.8    Colinge, J.P.9
  • 20
    • 33748300947 scopus 로고    scopus 로고
    • Quantum transport in twoand three-dimensional nanoscale transistors: Coupled mode effects in the nonequilibrium Green's function formalism
    • Aug.
    • M. Luisier, A. Schenk, and W. Fichtner, "Quantum transport in twoand three-dimensional nanoscale transistors: Coupled mode effects in the nonequilibrium Green's function formalism," J. Appl. Phys., vol. 100, no. 4, pp. 043 713-1-043 713-12, Aug. 2006.
    • (2006) J. Appl. Phys. , vol.100 , Issue.4 , pp. 0437131-04371312
    • Luisier, M.1    Schenk, A.2    Fichtner, W.3
  • 21
    • 34648857523 scopus 로고    scopus 로고
    • Three-dimensional simulation of onedimensional transport in silicon nanowire transistors
    • Sep.
    • G. Fiori and G. Iannaccone, "Three-dimensional simulation of onedimensional transport in silicon nanowire transistors," IEEE Trans. Nanotechnol., vol. 6, no. 5, pp. 524-529, Sep. 2007.
    • (2007) IEEE Trans. Nanotechnol. , vol.6 , Issue.5 , pp. 524-529
    • Fiori, G.1    Iannaccone, G.2
  • 22
    • 0004141098 scopus 로고
    • Tunneling studies of energy levels and selection rules in low-dimensional structures
    • May
    • W. Demmerle, J. Smoliner, E. Gornik, G. Böhm, and G. Weimann, "Tunneling studies of energy levels and selection rules in low-dimensional structures," Phys. Rev. B, Condens. Matter, vol. 47, no. 20, p. 13 574, May 1993.
    • (1993) Phys. Rev. B, Condens. Matter , vol.47 , Issue.20 , pp. 13574
    • Demmerle, W.1    Smoliner, J.2    Gornik, E.3    Böhm, G.4    Weimann, G.5
  • 23
    • 0029733988 scopus 로고    scopus 로고
    • Tunnelling spectroscopy of low-dimensional states
    • Jan.
    • J. Smoliner, "Tunnelling spectroscopy of low-dimensional states," Semicond. Sci. Technol., vol. 11, no. 1, pp. 1-16, Jan. 1996.
    • (1996) Semicond. Sci. Technol. , vol.11 , Issue.1 , pp. 1-16
    • Smoliner, J.1
  • 25
    • 0034291813 scopus 로고    scopus 로고
    • Nanoscale device modeling: The Green's function method
    • Oct.
    • S. Datta, "Nanoscale device modeling: The Green's function method," Superlatt. Microstruct., vol. 28, no. 4, pp. 253-278, Oct. 2000.
    • (2000) Superlatt. Microstruct. , vol.28 , Issue.4 , pp. 253-278
    • Datta, S.1
  • 26
    • 0000522192 scopus 로고
    • Landauer conductance formula and its generalization to finite voltages
    • Jul.
    • P. F. Bagwell and T. P. Orlando, "Landauer conductance formula and its generalization to finite voltages," Phys. Rev. B, Condens. Matter, vol. 40, no. 3, pp. 1456-1464, Jul. 1989.
    • (1989) Phys. Rev. B, Condens. Matter , vol.40 , Issue.3 , pp. 1456-1464
    • Bagwell, P.F.1    Orlando, T.P.2
  • 27
    • 34347245893 scopus 로고    scopus 로고
    • Effective-mass approach for n-type semiconductor nanowire MOSFETs arbitrarily oriented
    • May
    • M. Bescond, N. Cavassilas, and M. Lannoo, "Effective-mass approach for n-type semiconductor nanowire MOSFETs arbitrarily oriented," Nanotechnology, vol. 18, no. 25, p. 255 201, May 2007.
    • (2007) Nanotechnology , vol.18 , Issue.25 , pp. 255201
    • Bescond, M.1    Cavassilas, N.2    Lannoo, M.3
  • 28
    • 77955756447 scopus 로고    scopus 로고
    • Simulation of junctionless Si nanowire transistors with 3 nm gate length
    • Aug.
    • L. Ansari, B. Feldman, G. Fagas, J. P. Colinge, and J. C. Greer, "Simulation of junctionless Si nanowire transistors with 3 nm gate length," Appl. Phys. Lett., vol. 97, no. 6, p. 062 105, Aug. 2010.
    • (2010) Appl. Phys. Lett. , vol.97 , Issue.6 , pp. 062105
    • Ansari, L.1    Feldman, B.2    Fagas, G.3    Colinge, J.P.4    Greer, J.C.5
  • 29
    • 74349089665 scopus 로고    scopus 로고
    • A comparison between a fully-3D real-space versus coupled mode-space NEGF in the study of variability in gate-all-around Si nanowire MOSFET
    • A. Martinez, A. R. Brown, A. Asenov, and N. Seoane, "A comparison between a fully-3D real-space versus coupled mode-space NEGF in the study of variability in gate-all-around Si nanowire MOSFET," in Proc. Int. Conf. SISPAD, 2009, pp. 1-4.
    • (2009) Proc. Int. Conf. SISPAD , pp. 1-4
    • Martinez, A.1    Brown, A.R.2    Asenov, A.3    Seoane, N.4
  • 31
    • 58149215952 scopus 로고    scopus 로고
    • Characteristic features of 1-D ballistic transport in nanowire MOSFETs
    • Nov.
    • R. Kim and M. S. Lundstrom, "Characteristic features of 1-D ballistic transport in nanowire MOSFETs," IEEE Trans. Nanotechnol., vol. 7, no. 6, pp. 787-794, Nov. 2008.
    • (2008) IEEE Trans. Nanotechnol. , vol.7 , Issue.6 , pp. 787-794
    • Kim, R.1    Lundstrom, M.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.