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Volumn 42, Issue 4 B, 2003, Pages 2426-2428

Tunneling barrier structures in room-temperature operating silicon single-electron and single-hole transistors

Author keywords

Coulomb blockade oscillation; Room temperature operation; Silicon single electron transistor; Silicon single hole transistor; Tunneling barrier structure; Ultranarrow channel

Indexed keywords

BAND STRUCTURE; COULOMB BLOCKADE; ELECTRON TUNNELING; OSCILLATIONS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; THERMAL EFFECTS;

EID: 0038346863     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (31)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.