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1
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33847723617
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http://public.itrs.net
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2
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21644463455
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Selectively formed high mobility strained Ge PMOSFETs for high performance CMOS
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H. Shang et al., "Selectively formed high mobility strained Ge PMOSFETs for high performance CMOS," IEDM Tech. Dig., p. 157, 2004.
-
(2004)
IEDM Tech. Dig
, pp. 157
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Shang, H.1
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3
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21644483575
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Simulation study of Ge n-channel 7.5 nm DGFETs of arbitrary crystallographic alignment
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S.E. Laux, "Simulation study of Ge n-channel 7.5 nm DGFETs of arbitrary crystallographic alignment," IEDM Tech. Dig., p.135, 2004.
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(2004)
IEDM Tech. Dig
, pp. 135
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Laux, S.E.1
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4
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20444441501
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Generalized effective-mass approach for n-type metal-oxide-semiconductor field-effect transistors on arbitrarily oriented wafers
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A. Rahman, M.S. Lundstrom, A.V. Ghosh, "Generalized effective-mass approach for n-type metal-oxide-semiconductor field-effect transistors on arbitrarily oriented wafers," J. Appl. Phys., vol. 97, p.53702, 2005.
-
(2005)
J. Appl. Phys
, vol.97
, pp. 53702
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Rahman, A.1
Lundstrom, M.S.2
Ghosh, A.V.3
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5
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21644467582
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Band-structure effects in ballistic nanoscale MOSFETs
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A. Rahman, G. Klimeck, T.B. Boykin, M.S. Lundstrom, "Band-structure effects in ballistic nanoscale MOSFETs," IEDM Tech. Dig., p.139, 2004.
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(2004)
IEDM Tech. Dig
, pp. 139
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Rahman, A.1
Klimeck, G.2
Boykin, T.B.3
Lundstrom, M.S.4
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6
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0842266540
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Investigation of performance limits of germanium double-gated MOSFETs
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T. Low et al., "Investigation of performance limits of germanium double-gated MOSFETs," IEDM Tech. Dig., p.691, 2003.
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(2003)
IEDM Tech. Dig
, pp. 691
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Low, T.1
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7
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0035717885
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The ballistic FET: Design, capacitance and speed limit
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P.E. Solomon, S.E. Laux, "The ballistic FET: Design, capacitance and speed limit," IEDM Tech. Dig., p.95, 2001.
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(2001)
IEDM Tech. Dig
, pp. 95
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Solomon, P.E.1
Laux, S.E.2
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8
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33751414042
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Monte Carlo simulations of sub-100 nm InGaAs MOSFETs for digital applications
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K. Kalna, L. Yang and A. Asenov, "Monte Carlo simulations of sub-100 nm InGaAs MOSFETs for digital applications," Proc. ESSDERC 2005, p. 169, 2005.
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(2005)
Proc. ESSDERC
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Kalna, K.1
Yang, L.2
Asenov, A.3
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9
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21644484375
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3D quantum modeling and simulation of multiple-gate nanowire MOSFETs
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M. Bescond, K. Nehari, J.L. Autran, N. Cavassilas, D. Munteanu, M. Lannoo, "3D quantum modeling and simulation of multiple-gate nanowire MOSFETs," IEDM Tech. Dig., p.617, 2004.
-
(2004)
IEDM Tech. Dig
, pp. 617
-
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Bescond, M.1
Nehari, K.2
Autran, J.L.3
Cavassilas, N.4
Munteanu, D.5
Lannoo, M.6
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10
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33751401809
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Influence of band-structure on electron ballistic transport in Silicon nanowire MOSFET's: An atomistic study
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K. Nehari, N. Cavassilas, J.L. Autran, M. Bescond, D. Munteanu, M. Lannoo, "Influence of band-structure on electron ballistic transport in Silicon nanowire MOSFET's: an atomistic study," Proc. ESSDERC 2005. p. 229, 2005.
-
(2005)
Proc. ESSDERC
-
-
Nehari, K.1
Cavassilas, N.2
Autran, J.L.3
Bescond, M.4
Munteanu, D.5
Lannoo, M.6
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11
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4344606224
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A three-dimensional quantum simulation of silicon nanowire transistors with the effective-mass approximation
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J. Wang, E. Polizzi, M.S. Lundstrom, "A three-dimensional quantum simulation of silicon nanowire transistors with the effective-mass approximation, " J. Appl. Phys., vol. 96, p.2192, 2004.
-
(2004)
J. Appl. Phys
, vol.96
, pp. 2192
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Wang, J.1
Polizzi, E.2
Lundstrom, M.S.3
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12
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34547827353
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Properties of semiconductor surface inversion layers in the electric quantum limit
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F. Stem, W.E. Howard, "Properties of semiconductor surface inversion layers in the electric quantum limit," Phys. Rev., vol. 163, p.816, 1967.
-
(1967)
Phys. Rev
, vol.163
, pp. 816
-
-
Stem, F.1
Howard, W.E.2
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13
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33847734899
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M. Bescond et al., under preparation, available on request.
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M. Bescond et al., under preparation, available on request.
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