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Volumn 157, Issue 1, 2010, Pages

Effect of phosphorus and carbon incorporation in amorphous cobalt films prepared by chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

CARBON INCORPORATION; COBALT CARBIDES; COBALT FILM; DEPOSITION TEMPERATURES; FILM MICROSTRUCTURES; FILM RESISTIVITY; THERMAL STABILITY; TRIMETHYLPHOSPHINES;

EID: 72249107319     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3251283     Document Type: Article
Times cited : (17)

References (85)
  • 5
    • 0033580784 scopus 로고    scopus 로고
    • Composition, microstructure and magnetic properties of electroless-plated thin Co-P films
    • DOI 10.1016/S0257-8972(99)00161-9, PII S0257897299001619
    • R. Tarozait, M. Kurtinaitien, A. Dživ, and Z. Jusys, Surf. Coat. Technol. 0257-8972, 115, 57 (1999). 10.1016/S0257-8972(99)00161-9 (Pubitemid 29432875)
    • (1999) Surface and Coatings Technology , vol.115 , Issue.1 , pp. 57-65
    • Tarozaite, R.1    Kurtinaitiene, M.2    Dziuve, A.3    Jusys, Z.4
  • 8
  • 12
    • 0001273517 scopus 로고
    • 0039-6028, 10.1016/0039-6028(90)90527-F
    • H. Li and B. P. Tonner, Surf. Sci. 0039-6028, 237, 141 (1990). 10.1016/0039-6028(90)90527-F
    • (1990) Surf. Sci. , vol.237 , pp. 141
    • Li, H.1    Tonner, B.P.2
  • 14
  • 18
    • 0036132728 scopus 로고    scopus 로고
    • Use of a capacitance voltage technique to study copper drift diffusion in (porous) inorganic low-k materials
    • DOI 10.1016/S0167-9317(01)00588-3, PII S0167931701005883
    • F. Lanckmans and K. Maex, Microelectron. Eng. 0167-9317, 60, 125 (2002). 10.1016/S0167-9317(01)00588-3 (Pubitemid 33142458)
    • (2002) Microelectronic Engineering , vol.60 , Issue.1-2 , pp. 125-132
    • Lanckmans, F.1    Maex, K.2
  • 19
    • 33747792683 scopus 로고    scopus 로고
    • The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics
    • DOI 10.1016/j.microrel.2006.08.003, PII S0026271406002642, Proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
    • J. R. Lloyd, C. E. Murray, S. Ponoth, S. Cohen, and E. Liniger, Microelectron. Reliab. 0026-2714, 46, 1643 (2006). 10.1016/j.microrel.2006.08. 003 (Pubitemid 44278129)
    • (2006) Microelectronics Reliability , vol.46 , Issue.9-11 , pp. 1643-1647
    • Lloyd, J.R.1    Murray, C.E.2    Ponoth, S.3    Cohen, S.4    Liniger, E.5
  • 28
  • 30
    • 1042304389 scopus 로고    scopus 로고
    • 0040-6090, 10.1016/j.tsf.2003.10.111
    • H. Kizil and Ch. Steinbrüchel, Thin Solid Films 0040-6090, 449, 158 (2004). 10.1016/j.tsf.2003.10.111
    • (2004) Thin Solid Films , vol.449 , pp. 158
    • Kizil, H.1    Steinbrüchel, Ch.2
  • 31
    • 56949090810 scopus 로고    scopus 로고
    • 0040-6090, 10.1016/j.tsf.2008.10.009
    • L. B. Henderson and J. G. Ekerdt, Thin Solid Films 0040-6090, 517, 1645 (2009). 10.1016/j.tsf.2008.10.009
    • (2009) Thin Solid Films , vol.517 , pp. 1645
    • Henderson, L.B.1    Ekerdt, J.G.2
  • 33
    • 45049084092 scopus 로고    scopus 로고
    • 0169-4332, 10.1016/j.apsusc.2008.02.160
    • D. -C. Perng, J. -B. Yeh, and K. -C. Hsu, Appl. Surf. Sci. 0169-4332, 254, 6059 (2008). 10.1016/j.apsusc.2008.02.160
    • (2008) Appl. Surf. Sci. , vol.254 , pp. 6059
    • Perng, D.-C.1    Yeh, J.-B.2    Hsu, K.-C.3
  • 34
    • 0022199989 scopus 로고
    • MAGNETIC ANISOTROPY, MAGNETOSTRICTION AND INTERMEDIATE RANGE ORDER IN Co-P ALLOYS.
    • DOI 10.1016/0304-8853(85)90207-0
    • K. Hüller, M. Sydow, and G. Dietz, J. Magn. Magn. Mater. 0304-8853, 53, 269 (1985). 10.1016/0304-8853(85)90207-0 (Pubitemid 16462390)
    • (1985) Journal of Magnetism and Magnetic Materials , vol.53 , Issue.3 , pp. 269-274
    • Hueller, K.1    Sydow, M.2    Dietz, G.3
  • 40
    • 0042363341 scopus 로고    scopus 로고
    • 0169-4332, 10.1016/S0169-4332(03)00597-X
    • Q. Zhao, D. W. Greve, and K. Barmak, Appl. Surf. Sci. 0169-4332, 219, 136 (2003). 10.1016/S0169-4332(03)00597-X
    • (2003) Appl. Surf. Sci. , vol.219 , pp. 136
    • Zhao, Q.1    Greve, D.W.2    Barmak, K.3
  • 42
    • 34547669265 scopus 로고    scopus 로고
    • Chemical routes to ultra thin films for copper barriers and liners
    • DOI 10.1016/j.surfcoat.2007.03.019, PII S0257897207003386
    • J. Shin, H. -W. Kim, G. S. Hwang, and J. G. Ekerdt, Surf. Coat. Technol. 0257-8972, 201, 9256 (2007). 10.1016/j.surfcoat.2007.03.019 (Pubitemid 47209355)
    • (2007) Surface and Coatings Technology , vol.201 , Issue.22-23 SPEC. ISS. , pp. 9256-9259
    • Shin, J.1    Kim, H.-W.2    Hwang, G.S.3    Ekerdt, J.G.4
  • 45
    • 0035882705 scopus 로고    scopus 로고
    • Thermal stability and hardness of metastable Co - C composite alloy films
    • DOI 10.1016/S0921-5093(00)01860-8, PII S0921509300018608
    • Y. Fukumiya, Y. Haga, and O. Nittono, Mater. Sci. Eng., A 0921-5093, 312, 248 (2001). 10.1016/S0921-5093(00)01860-8 (Pubitemid 32602413)
    • (2001) Materials Science and Engineering A , vol.312 , Issue.1-2 , pp. 248-252
    • Fukumiya, Y.1    Haga, Y.2    Nittono, O.3
  • 46
    • 34548593574 scopus 로고    scopus 로고
    • Glass-forming range and glass thermal stability in binary 3d TM-C systems
    • DOI 10.1016/j.jnoncrysol.2007.05.127, PII S0022309307006424, Liquid and Amorphous Metals XII Proceedings of the 12th International Conference on Liquid and Amorphous Metals
    • E. Bauer-Grosse and A. Aouni, J. Non-Cryst. Solids 0022-3093, 353, 3644 (2007). 10.1016/j.jnoncrysol.2007.05.127 (Pubitemid 47390833)
    • (2007) Journal of Non-Crystalline Solids , vol.353 , Issue.32-40 , pp. 3644-3649
    • Bauer-Grosse, E.1    Aouni, A.2
  • 47
    • 0028407682 scopus 로고
    • 0956-7151, 10.1016/0956-7151(94)90140-6
    • T. J. Konno and R. Sinclair, Acta Metall. Mater. 0956-7151, 42, 1231 (1994). 10.1016/0956-7151(94)90140-6
    • (1994) Acta Metall. Mater. , vol.42 , pp. 1231
    • Konno, T.J.1    Sinclair, R.2
  • 49
    • 33748709832 scopus 로고    scopus 로고
    • High-quality cobalt thin films by plasma-enhanced atomic layer deposition
    • DOI 10.1149/1.2338777
    • H. -B.-R. Lee and H. Kim, Electrochem. Solid-State Lett. 1099-0062, 9, G323 (2006). 10.1149/1.2338777 (Pubitemid 44395118)
    • (2006) Electrochemical and Solid-State Letters , vol.9 , Issue.11
    • Lee, H.-B.-R.1    Kim, H.2
  • 52
    • 33947246996 scopus 로고
    • T. B. Massalski, H. Okamoto, P. R. Subramanian, and L. Kacprzak, Editors, ASM International, Materials Park, OH
    • V. B. Chernogorenko, V. G. Ivanchenko, and L. Ya. Kulik, in Binary Phase Diagrams, T. B. Massalski, H. Okamoto, P. R. Subramanian, and, L. Kacprzak, Editors, p. 2979, ASM International, Materials Park, OH (1990).
    • (1990) Binary Phase Diagrams , pp. 2979
    • Chernogorenko, V.B.1    Ivanchenko, V.G.2    Kulik, L.Ya.3
  • 57
    • 0022772388 scopus 로고
    • ALKALI PROMOTION ON COBALT: SURFACE ANALYSIS OF THE EFFECTS OF POTASSIUM ON CARBON MONOXIDE ADSORPTION AND FISCHER-TROPSCH REACTION.
    • DOI 10.1016/0169-4332(86)90074-7
    • D. A. Wesner, G. Linden, and H. P. Bonzel, Appl. Surf. Sci. 0169-4332, 26, 335 (1986). 10.1016/0169-4332(86)90074-7 (Pubitemid 17469044)
    • (1986) Applied Surface Science , vol.26 , Issue.3 , pp. 335-356
    • Wesner, D.A.1    Linden, G.2    Bonzel, H.P.3
  • 58
    • 0001015988 scopus 로고
    • 0039-6028, 10.1016/0039-6028(88)90605-X
    • J. Nakamura and I. Toyoshima, Surf. Sci. 0039-6028, 201, 185 (1988). 10.1016/0039-6028(88)90605-X
    • (1988) Surf. Sci. , vol.201 , pp. 185
    • Nakamura, J.1    Toyoshima, I.2
  • 59
    • 0003715129 scopus 로고    scopus 로고
    • (National Institute of Standards and Technology, Gaithersburg), last accessed April 16, 2009
    • NIST X-Ray Photoelectron Spectroscopy Database, Version 3.5 (National Institute of Standards and Technology, Gaithersburg, 2003), http://srdata.nist. gov/xps/, last accessed April 16, 2009.
    • (2003) NIST X-Ray Photoelectron Spectroscopy Database, Version 3.5
  • 61
    • 4243338319 scopus 로고
    • 0039-6028, 10.1016/0039-6028(89)90485-8
    • X. -L. Zhou and J. M. White, Surf. Sci. 0039-6028, 221, 534 (1989). 10.1016/0039-6028(89)90485-8
    • (1989) Surf. Sci. , vol.221 , pp. 534
    • Zhou, X.-L.1    White, J.M.2
  • 67
    • 0029254277 scopus 로고
    • 0956-7151, 10.1016/0956-7151(94)00289-T
    • T. J. Konno and R. Sinclair, Acta Metall. Mater. 0956-7151, 43, 471 (1995). 10.1016/0956-7151(94)00289-T
    • (1995) Acta Metall. Mater. , vol.43 , pp. 471
    • Konno, T.J.1    Sinclair, R.2
  • 68
    • 63849264455 scopus 로고    scopus 로고
    • 1422-6375, 10.4028/www.scientific.net/JMNM.24-25.57
    • T. J. Konno and K. Bandoh, J. Metastable Nanocryst. Mater. 1422-6375, 24, 57 (2005). 10.4028/www.scientific.net/JMNM.24-25.57
    • (2005) J. Metastable Nanocryst. Mater. , vol.24 , pp. 57
    • Konno, T.J.1    Bandoh, K.2
  • 69
    • 0035871481 scopus 로고    scopus 로고
    • Characterization of electroless deposited Co (W,P) thin films for encapsulation of copper metallization
    • DOI 10.1016/S0921-5093(00)01348-4, PII S0921509300013484
    • A. Kohn, M. Eizenberg, Y. Shacham-Diamand, and Y. Sverdlov, Mater. Sci. Eng., A 0921-5093, 302, 18 (2001). 10.1016/S0921-5093(00)01348-4 (Pubitemid 32337784)
    • (2001) Materials Science and Engineering A , vol.302 , Issue.1 , pp. 18-25
    • Kohn, A.1    Eizenberg, M.2    Shacham-Diamand, Y.3    Sverdlov, Y.4
  • 71
    • 41449102805 scopus 로고    scopus 로고
    • 0884-2914, 10.1557/jmr.2008.0082
    • Y. H. Lu and Y. G. Shen, J. Mater. Res. 0884-2914, 23, 671 (2008). 10.1557/jmr.2008.0082
    • (2008) J. Mater. Res. , vol.23 , pp. 671
    • Lu, Y.H.1    Shen, Y.G.2
  • 72
    • 35248846921 scopus 로고    scopus 로고
    • 5-nm-thick TaSiC amorphous films stable up to 750 °c as a diffusion barrier for copper metallization
    • DOI 10.1063/1.2799245
    • T. -Y. Lin, H. -Y. Cheng, T. -S. Chin, C. -F. Chiu, and J. -S. Fang, Appl. Phys. Lett. 0003-6951, 91, 152908 (2007). 10.1063/1.2799245 (Pubitemid 47568961)
    • (2007) Applied Physics Letters , vol.91 , Issue.15 , pp. 152908
    • Lin, T.-Y.1    Cheng, H.-Y.2    Chin, T.-S.3    Chiu, C.-F.4    Fang, J.-S.5
  • 79
    • 37049227754 scopus 로고
    • 0036-8075, 10.1126/science.152.3718.34
    • W. S. Williams, Science 0036-8075, 152, 34 (1966). 10.1126/science.152. 3718.34
    • (1966) Science , vol.152 , pp. 34
    • Williams, W.S.1
  • 80
    • 0031097520 scopus 로고    scopus 로고
    • 1047-4838, 10.1007/BF02914655
    • W. S. Williams, JOM 1047-4838, 49, 38 (1997). 10.1007/BF02914655
    • (1997) JOM , vol.49 , pp. 38
    • Williams, W.S.1
  • 84
    • 34047158735 scopus 로고    scopus 로고
    • Invited review article: Atom probe tomography
    • DOI 10.1063/1.2709758
    • T. F. Kelly and M. K. Miller, Rev. Sci. Instrum. 0034-6748, 78, 031101 (2007). 10.1063/1.2709758 (Pubitemid 46517307)
    • (2007) Review of Scientific Instruments , vol.78 , Issue.3 , pp. 031101
    • Kelly, T.F.1    Miller, M.K.2
  • 85
    • 24044513277 scopus 로고    scopus 로고
    • Thermal stability of electrodeposited nanocrystalline Co-1.1at.%P
    • DOI 10.1016/j.actamat.2005.06.006, PII S1359645405003599
    • P. Choi, M. da Silva, U. Klement, T. Al-Kassab, and R. Kirchheim, Acta Mater. 1359-6454, 53, 4473 (2005). 10.1016/j.actamat.2005.06.006 (Pubitemid 41217459)
    • (2005) Acta Materialia , vol.53 , Issue.16 , pp. 4473-4481
    • Choi, P.1    Da Silva, M.2    Klement, U.3    Al-Kassab, T.4    Kirchheim, R.5


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