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Volumn 611, Issue 1, 2009, Pages 52-68

Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

Author keywords

Defect analysis; EPI; FZ; MCz; Neff predictions; S LHC tracker; Silicon detectors; TSC measurements

Indexed keywords

15-MEV ELECTRONS; ANNEALING EFFECTS; COMPARATIVE STUDIES; DAMAGE EFFECTS; DAMAGE PROPERTIES; DEEP HOLE TRAP; DEFECT ANALYSIS; DEFECTS INDUCED; DEPLETION VOLTAGE; DETECTOR PERFORMANCE; DISORDERED REGIONS; EPI; OXYGEN CONCENTRATIONS; OXYGEN CONTENT; RADIATION INDUCED DEFECTS; RADIATION-INDUCED; REACTOR NEUTRONS; REVERSE ANNEALING; SHALLOW DONORS; SI DEVICES; SILICON GROWTH; TWO-POINT; WORK FOCUS;

EID: 71849097561     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.09.065     Document Type: Article
Times cited : (97)

References (72)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.