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Volumn 568, Issue 1, 2006, Pages 66-71

Epitaxial silicon detectors for particle tracking-Radiation tolerance at extreme hadron fluences

Author keywords

Annealing; Charge collection efficiency; Current related damage rate; Defect spectroscopy; Depletion voltage; Epitaxial silicon; Neutron and proton damage; Oxygen dimers; Radiation tolerance for S LHC; Shallow donor creation; Tracking detectors

Indexed keywords

ANNEALING; ELECTRIC CURRENTS; EPITAXIAL GROWTH; HIGH ENERGY PHYSICS; NEUTRON IRRADIATION; PARTICLE BEAM TRACKING; SEMICONDUCTOR DIODES;

EID: 33750368990     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.203     Document Type: Article
Times cited : (28)

References (19)
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    • A. Barcz, SIMS laboratory, Institute of Phhysics, Warsaw, private communication.
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    • L. Long, Institute for Micro Sensors CiS, Erfurt, private communication.
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    • M. Moll, Ph.D. Thesis, University of Hamburg 1999, DESY-THESIS -1999-040, December 1999.
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    • A. Schramm, Diploma Thesis, University of Hamburg, 2003.
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    • Y.L. Lee, J. von Boehm, M. Pesola, R.M. Nieminen, Phys. Rev. B 65 (2002) 085205.
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    • J. Stahl, Ph.D. Thesis, University of Hamburg, DESY-THESIS-2004-028, July 2004.
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    • I. Dolenc, et al., Study of leakage current and effective doping concentration in irradiated epi-Si detectors, presented at fifth RD50 Workshop, 2004, Florence.
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    • I. Dolenc, V. Cindro, E. Fretwurst, G. Kramberger, G. Lindström, I. Mandic, M. Mikuz, Room temperature annealing of EPI-Si detectors; 7th RD50 workshop, CERN 14-16 November 2005; http://rd50.web.cern.ch/rd50/7th-workshop/default.htm.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.