Impact of annealing of trapping times on charge collection in irradiated silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 579, Issue 2 SPEC. ISS., 2007, Pages 762-765

  Kramberger, G ^a   Cindro, V ^a   Mandic I ^a   Mikuz M ^a,b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

Charge collection efficiency; Effective carrier trapping time; Silicon detectors

Indexed keywords

ANNEALING; CHARGE TRAPPING; COLLIDING BEAM ACCELERATORS; ION BOMBARDMENT; PROBABILITY;

CHARGE COLLECTION EFFICIENCY; EFFECTIVE CARRIER TRAPPING TIME; LARGE HADRON COLLIDER (LHC);

SILICON DETECTORS;

EID: 34547750937     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.294     Document Type: Article

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