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Volumn 68, Issue 23, 2003, Pages
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Evidence for identification of the divacancy-oxygen center in Si
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Author keywords
[No Author keywords available]
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Indexed keywords
OXYGEN;
SILICON;
ARTICLE;
CORRELATION COEFFICIENT;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
ELECTRON;
HEAT TREATMENT;
IRRADIATION;
SPECTROSCOPY;
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EID: 0842343418
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.68.233202 Document Type: Article |
Times cited : (52)
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References (10)
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