Developments for radiation hard silicon detectors by defect engineering - Results by the CERN RD48 (ROSE) Collaboration
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Lindstrom G
a
Ahmed, M
b
Albergo, S
c
Allport, P
d
Anderson, D
e
Andricek, L
f
Angarano, M M
g
Augelli, V
h
Bacchetta, N
i
Bartalini, P
g
Bates, R
i
Biggeri, U
k
Bilei, G M
g
Bisello, D
j
Boemi, D
c
Borchi, E
k
Botila, T
l
Brodbeck, T J
m
Bruzzi, M
k
Budzynski, T
n
Burger, P
o
Campabadal, F
p,q
Casse, G
d
Catacchini, E
k
Chilingarov, A
m
Ciampolini, P
g
Cindro, V
r
Costa, M J
p,q
Creanza, D
h
Clauws, P
s
Da Via, C
b
Davies, G
t
De Boer, W
u
Dell'orso R
v
De Palma, M
h
Dezillie, B
w
Eremin, V
x
Evrard, O
o
Fallica, G
y
Fanourakis, G
z
Feick, H
aa
Focardi, E
k
Fonseca, L
p,q
Fretwurst, E
a
Fuster, J
p,q
Gabathuler, K
ab
Glaser, M
ac
Grabiec, P
n
Grigoriev, E
u
Hall, G
ad
Hanlon, M
d
Hauler, F
u
Heising, S
u
Holmes Siedle, A
b
Horisberger, R
ab
Hughes, G
m
Huhtinen, M
ac
Ilyashenko, I
x
Ivanov, A
x
Jones, B K
m
Jungermann, L
u
Kaminsky, A
i
Kohout, Z
ae
Kramberger, G
r
Kuhnke, M
a
Kwan, S
e
Lemeilleur, F
ac
Leroy, C
aq
Letheren, M
ac
Li, Z
w
Ligonzo, T
h
Linhart, V
ae
Litovchenko, P
ag
Loukas, D
z
Lozano, M
p,q
Luczynski, Z
n
Lutz, G
f
Macevoy, B
ad
Manolopoulos, S
j
Markou, A
z
Martinez, C
p,q
Messineo, A
v
Miku, M
r
Moll, M
ac
Nossarzewska, E
n
Ottaviani, G
ah
Oshea, V
j
Parrini, G
k
Passeri, D
g
Petre, D
l
Pickford, A
j
Pintilie, I
l
Pintilie, L
l
Pospisil, S
ae
Potenza, R
c
Radicci, V
h
Raine, C
j
Rafi, J M
p,q
Ratoff, P N
m
Richter, R H
f
Riedler, P
ac
Roe, S
ac
Roy, P
af
Ruzin, A
ai
Ryazanov, A I
aj
Santocchia, A
ad
Schiavulli, L
h
Sicho, P
ak
Siotis, I
z
Sloan, T
m
Slysz, W
n
Smith, K
j
Solanky, M
b
Sopko, B
ae
Stolze, K
al
Sundby Avset, B
am
Svensson, B
an
Tivarus, C
l
Tonelli, G
v
Tricomi, A
c
Tzamarias, S
z
Valvo, G
y
Vasilescu, A
ao
Vayaki, A
z
Verbitskaya, E
x
Verdini, P
v
Vrba, V
ak
Watts, S
b
Weber, E R
aa
Wegrzecki, M
n
Wegrzecka, I
n
Weilhammer, P
ac
Wheadon, R
v
Wilburn, C
ap
Wilhelm, I
aq
Wunstorf, R
ar
Wustenfeld J
ar
Wyss, J
i
Zankel, K
ac
Zabierowski, P
n
Zontar, D
q
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85041879686
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Academy of Sciences, Physics Inst. Warsaw, Poland
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Zielinski, M.1
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CiS Mikrosensorik gGmbH, Erfurt, Germany
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Stolze, K.1
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Micron Semiconductor Limited, UK-Lancing
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Wilburn, C.1
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Ph.D. Thesis, Hamburg University, 1999, DESY-THESIS-1999-040, ISSN 1435-8085
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Moll, M.1
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85041873369
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Semiconductor Laboratory, MPI Munich, Germany, September, private communication
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(2000)
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Andricek, L.1
Lutz, G.2
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Ph.D. thesis, University of Dortmund, see also [3], and ROSE/TN/2000-05 in [4]
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(2000)
, pp. 91
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Wüstenfeld, J.1
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CERN/EP-MIC-SD and INPE Bucharest, June, private communication
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(2000)
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Vasilescu, A.1
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in [3], see also [21]
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Li, Z.1
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recent analysis of π- and p-induced damage, August, private communication
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(2000)
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Lindström, G.1
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85041865756
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Ph.D.-Thesis, Hamburg, see [3], and ROSE/TN/2000-04 in [4]
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(2000)
, pp. 490
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Kuhnke, M.1
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85041870975
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The effect of oxygen impurities on radiation hardness of FZ silicon detectors for HEP after n, p and gamma irradiation, accepted for publication
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(2000)
IEEE Trans. Nucl. Sci.
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Dezillie, B.1
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