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Volumn 465, Issue 1, 2001, Pages 60-69

Developments for radiation hard silicon detectors by defect engineering - Results by the CERN RD48 (ROSE) Collaboration

(141)  Lindstrom G a   Ahmed, M b   Albergo, S c   Allport, P d   Anderson, D e   Andricek, L f   Angarano, M M g   Augelli, V h   Bacchetta, N i   Bartalini, P g   Bates, R i   Biggeri, U k   Bilei, G M g   Bisello, D j   Boemi, D c   Borchi, E k   Botila, T l   Brodbeck, T J m   Bruzzi, M k   Budzynski, T n   more..


Author keywords

Annealing studies; Consequences for high energy physics applications; Gamma , neutron , proton and pion irradiation; Improved radiation tolerance by oxygen enrichment; Silicon detectors

Indexed keywords

ANNEALING; GAMMA RAYS; HIGH ENERGY PHYSICS; NEUTRON IRRADIATION; OXYGEN; PROTON IRRADIATION; SILICON SENSORS;

EID: 0035367254     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00347-3     Document Type: Article
Times cited : (106)

References (32)
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    • Ph.D. thesis, University of Dortmund, see also [3], and ROSE/TN/2000-05 in [4]
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    • recent analysis of π- and p-induced damage, August, private communication
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    • Ph.D.-Thesis, Hamburg, see [3], and ROSE/TN/2000-04 in [4]
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    • The effect of oxygen impurities on radiation hardness of FZ silicon detectors for HEP after n, p and gamma irradiation, accepted for publication
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.