Thermally stimulated current method applied on diodes with high concentration of deep trapping levels

Applied Physics Letters

Volumn 78, Issue 4, 2001, Pages 550-552

  Pintilie, I ^a   Pintilie, L ^a   Moll, M ^b   Fretwurst, E ^c   Lindstroem, G ^c  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b CERN   (Switzerland)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001640532     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1335852     Document Type: Article

References (6)

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2. H. Feick, E. Fretwurst, P. Heydarpoor, G. Lindstroem, and M. Moll, Nucl. Instrum. Methods Phys. Res. A 388, 323 (1997).
3. M. Moll, H. Feick, E. Fretwurst, and G. Lindstroem, Nucl. Instrum. Methods Phys. Res. A 409, 194 (1998).
4. Michael Moll, PhD thesis, DESY, 1999.
5. L. Forbes and C. T. Sah, Solid-State Electron. 14, 182 (1971).
6. I. Pintilie, C. Tivarus, L. Pintilie, M. Moll, E. Fretwurst, and G. Lindstroem, Proceedings of the Second ENDEASD Workshop (Kista, Stockholm, Sweden, 27-29, June, 2000), edited by C. Claeys, pp. 79-88.