Electron channelling based crystallography

Ultramicroscopy

Volumn 107, Issue 6-7, 2007, Pages 551-558

  Van Aert, S ^a   Geuens, P ^a   Van Dyck, D ^a   Kisielowski, C ^b   Jinschek, J R ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Virginia Polytechnic Institute and State University   (United States)

Author keywords

Electron diffraction and elastic scattering theory; Image simulation; Reflection and scanning electron microscopy; Theories of diffraction and scattering; Transmission

Indexed keywords

CRYSTAL DEFECTS; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON TRAPS; ELECTROSTATICS; REFLECTION; SCANNING ELECTRON MICROSCOPY;

ATOM COLUMNS; DYNAMICAL SCATTERING; ELASTIC SCATTERING THEORY; IMAGE SIMULATION;

CRYSTALLOGRAPHY;

ARTICLE; CALCULATION; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; CRYSTALLOGRAPHY; DYNAMICS; ELECTRON; ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS;

EID: 33847136275     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.031     Document Type: Article

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