Amplitude contrast - A way to obtain directly interpretable high-resolution images in a spherical aberration corrected transmission electron microscope

Physica Status Solidi (A) Applied Research

Volumn 166, Issue 1, 1998, Pages 357-366

  Foschepoth, M ^a   Kohl, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CRYSTAL ORIENTATION; IMAGING TECHNIQUES; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

AMPLITUDE CONTRAST IMAGING; IMAGE SIMULATIONS;

ELECTRON MICROSCOPES;

EID: 0032027034     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:1<357::AID-PSSA357>3.0.CO;2-F     Document Type: Article

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