Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

Ultramicroscopy

Volumn 72, Issue 3-4, 1998, Pages 109-119

  Uhlemann, Stephan ^a,b   Haider, Maximilian ^a,b  

^a EUROPEAN MOLECULAR BIOLOGY LABORATORY   (Germany)

^b CEOS GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON LENSES; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY;

RESIDUAL WAVE ABERRATIONS;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; DIFFRACTION; MATHEMATICAL ANALYSIS; PHASE CONTRAST MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032077383     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00102-2     Document Type: Article

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