Practical aspects of atomic resolution imaging and analysis in STEM

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 125-139

  James, E M ^a   Browning, N D ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Atomic resolution; EELS; STEM; Z contrast imaging

Indexed keywords

DOPING (ADDITIVES); ELECTRON EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; GRAIN BOUNDARIES; IMAGING TECHNIQUES; IRON; SCANNING ELECTRON MICROSCOPY; SILICON; SINGLE CRYSTALS; STRONTIUM COMPOUNDS;

SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); Z CONTRAST IMAGING;

TRANSMISSION ELECTRON MICROSCOPY;

ALLOY; SILICON; STRONTIUM; TITANIUM DIOXIDE;

ATOM; CONFERENCE PAPER; CRYSTAL; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; IMAGING SYSTEM; OPTICAL RESOLUTION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033045128     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00018-2     Document Type: Conference Paper

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