On the monochromatisation of high brightness electron sources for electron microscopy

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 43-51

  Mook, H W ^a   Kruit, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Electron energy loss spectroscopy; Electron sources

Indexed keywords

BRIGHTNESS; CONFERENCE PAPER; DEVICE; ELECTRON BEAM; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ENERGY TRANSFER; FILTER; OPTICAL INSTRUMENTATION; OPTICAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; ELECTRON OPTICS; ELECTRON SOURCES; LENSES; WAVE FILTERS;

ELECTRON BEAM MONOCHROMATIZATION; WIEN FILTERS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032650966     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00034-0     Document Type: Conference Paper

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