Calculations of HREM image intensity using Monte Carlo integration

Ultramicroscopy

Volumn 104, Issue 3-4, 2005, Pages 271-280

  Chang, L Y ^a   Meyer, R R ^a   Kirkland, A I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Exit wave reconstruction; High resolution transmission electron microscopy (HRTEM); Image simulation

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; MONTE CARLO METHODS; SAMPLING;

BEAM DIVERGENCE; COHERENT SOURCES; IMAGE INTENSITY; TRANSMISSION CROSS COEFFICIENT (TCC);

HIGH RESOLUTION ELECTRON MICROSCOPY;

ALGORITHM; ARTICLE; ATOMIC PARTICLE; IMAGE ANALYSIS; MATHEMATICAL COMPUTING; MONTE CARLO METHOD; SPIKE WAVE; THICKNESS;

EID: 22144483832     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.05.003     Document Type: Article

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