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Journal of Analytical Atomic Spectrometry

Volumn 23, Issue 6, 2008, Pages 792-798

Synchrotron radiation induced TXRF

(4) Streli, C a Wobrauschek, P a Meirer, F a Pepponi, G b

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b ITC IRST (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISATION; DETECTION LIMITS; EXCITATION SOURCES; FLUORESCENCE MODE; LINEAR POLARIZATION; ORBITAL PLANES; PERFECT CRYSTALS; SMALL SAMPLES; SR-TXRF; SYNCHROTRON RADIATION FACILITY; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; TRACE LEVEL; WIDE SPECTRAL RANGE;

CHEMICAL SPECIATION; FLUORESCENCE; MONOCHROMATORS; SYNCHROTRON RADIATION; SYNCHROTRONS; TRACE ANALYSIS; X RAY TUBES;

ABSORPTION SPECTROSCOPY;

EID: 65249190664 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b719508g Document Type: Review

Times cited : (45)

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