A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L

X-Ray Spectrometry

Volumn 34, Issue 5, 2005, Pages 451-455

  Streli, C ^a   Pepponi, G ^b   Wobrauschek, P ^a   Jokubonis, C ^a   Falkenberg, G ^c   Zaray, G ^d  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b ITC IRST   (Italy)

^c DESY   (Germany)

^d EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; CRYSTAL STRUCTURE; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; MONOCHROMATORS; SILICON WAFERS; TRACE ANALYSIS; TRACE ELEMENTS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

BEAM-LINES; DETECTION LIMITS; HIGH REPRODUCIBILITY; MICRO FOCUS; RADIATION-INDUCED; TOTAL REFLECTION X-RAY FLUORESCENCE; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; ULTRATRACES ANALYSIS; VACUUM CHAMBERS; X-RAY ABSORPTION NEAR-EDGE STRUCTURE;

SYNCHROTRON RADIATION;

EID: 25444456412     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.861     Document Type: Conference Paper

References (16)

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