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Volumn 521, Issue , 2000, Pages 161-166

Investigation of na impurities on si wafer surfaces using TXRF

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DROPS; FLUORESCENCE; SILICON WAFERS; SODIUM; SYNCHROTRONS;

EID: 0042850463     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1291778     Document Type: Conference Paper
Times cited : (2)

References (10)
  • 3
    • 85096451760 scopus 로고    scopus 로고
    • Pianetta, K. Baur, S. Brennan, D. Werho, J. Wang, to be published in Thin Solid Films
    • P. Pianetta, K. Baur, S. Brennan, D. Werho, J. Wang, to be published in Thin Solid Films.
  • 7
    • 85096447217 scopus 로고    scopus 로고
    • K. Baur, J. Kerner, S. Brennan, Pianetta, to be published
    • K. Baur, J. Kerner, S. Brennan, P. Pianetta, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.