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Volumn 521, Issue , 2000, Pages 161-166
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Investigation of na impurities on si wafer surfaces using TXRF
a a b c a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
DROPS;
FLUORESCENCE;
SILICON WAFERS;
SODIUM;
SYNCHROTRONS;
DETECTION LIMITS;
EXCITATION SOURCES;
MINIMUM DETECTION LIMITS;
SI WAFER;
STANFORD;
TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS;
TUNABILITIES;
SYNCHROTRON RADIATION;
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EID: 0042850463
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.1291778 Document Type: Conference Paper |
Times cited : (2)
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References (10)
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