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Volumn 61, Issue 10-11 SPEC. ISS., 2006, Pages 1129-1134

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

Author keywords

Aerosol; SR TXRF; Synchrotron radiation; XANES

Indexed keywords

AEROSOLS; FLUORESCENCE; MONOCHROMATORS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

EID: 34548730232     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2006.08.010     Document Type: Article
Times cited : (31)

References (9)
  • 2
    • 0036895882 scopus 로고    scopus 로고
    • Looking at trace impurities on silicon wafers with synchrotron radiation
    • Baur K., Brennan S., Pianetta P., and Opila R. Looking at trace impurities on silicon wafers with synchrotron radiation. Anal. Chem. (2002) 608A-616A
    • (2002) Anal. Chem.
    • Baur, K.1    Brennan, S.2    Pianetta, P.3    Opila, R.4
  • 5
    • 37949000089 scopus 로고    scopus 로고
    • www.radiantdetectors.com/vortex.html.
  • 6
    • 37949011390 scopus 로고    scopus 로고
    • Characterization of a Radiant Vortex Silicon Multi-Cathode X-ray Spectrometer for (Total Reflection) X-ray Fluorescence Applications
    • Falkenberg G. Characterization of a Radiant Vortex Silicon Multi-Cathode X-ray Spectrometer for (Total Reflection) X-ray Fluorescence Applications. HASYLAB Internal Report 2004 (2005)
    • (2005) HASYLAB Internal Report 2004
    • Falkenberg, G.1
  • 7
    • 84990658473 scopus 로고
    • Analysis of X-ray spectra by iterative least squares (AXIL): new developments
    • Vekemans B., Janssens K., Vincze L., Adams F., and Van Espen P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments. X-ray Spectrom. 23 (1994) 278-285
    • (1994) X-ray Spectrom. , vol.23 , pp. 278-285
    • Vekemans, B.1    Janssens, K.2    Vincze, L.3    Adams, F.4    Van Espen, P.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.