Comparison of synchrotron radiation total reflection X-ray fluorescence excitation-detection geometries for samples with differing matrices

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 58, Issue 12, 2003, Pages 2139-2144

  Pepponi, G ^a   Streli, C ^a   Wobrauschek, P ^a   Zamini, S ^a   Zoger N ^a   Falkenberg, G ^b  

^a TU WIEN   (Austria)

^b DESY   (Germany)

Author keywords

Excitation detection geometry; Sample matrix; SR TXRF

Indexed keywords

CONTAMINATION; ELECTROMAGNETIC WAVE POLARIZATION; MAGNETS; MATRIX ALGEBRA; MICROMETERS; NICKEL; PARTICLE DETECTORS; SPECTROMETERS; STEEL; SYNCHROTRON RADIATION;

EXCITATION-DETECTION GEOMETRY; LINEAR POLARIZATION; SELF-ABSORPTION EFFECTS; TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF);

X RAY SPECTROSCOPY;

EID: 0348221808     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(03)00220-9     Document Type: Conference Paper

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