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Volumn 382, Issue 8, 2005, Pages 1958-1964
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Direct analysis of Al2O3 powders by total reflection X-ray fluorescence spectrometry
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Author keywords
Al2O3; Direct solids analysis; Total reflection X ray fluorescence
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Indexed keywords
ALUMINA;
ALUMINUM POWDER METALLURGY;
DEPOSITION;
EVAPORATION;
FLUORESCENCE;
GRAIN SIZE AND SHAPE;
IMPURITIES;
LIGHT REFLECTION;
QUARTZ;
SLURRIES;
SYNCHROTRON RADIATION;
X RAY SPECTROSCOPY;
AL2O3;
DIRECT SOLID ANALYSIS;
TOTAL REFLECTION X-RAY FLUORESCENCE;
TRACE IMPURITIES;
TRACE ANALYSIS;
ALUMINUM OXIDE;
CALCIUM;
GALLIUM;
TRACE ELEMENT;
ARTICLE;
CHEMISTRY;
METHODOLOGY;
PARTICLE SIZE;
SENSITIVITY AND SPECIFICITY;
SPECTROFLUOROMETRY;
SPECTROMETRY;
ALUMINUM OXIDE;
CALCIUM;
GALLIUM;
PARTICLE SIZE;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY, FLUORESCENCE;
SPECTROMETRY, X-RAY EMISSION;
TRACE ELEMENTS;
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EID: 23944446282
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-005-3295-0 Document Type: Article |
Times cited : (38)
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References (21)
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