Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 58, Issue 12, 2003, Pages 2239-2244

  Falkenberg, G ^a   Pepponi, G ^b   Streli, C ^b   Wobrauschek, P ^b  

^a DESY   (Germany)

^b TU WIEN   (Austria)

Author keywords

Fluorescence mode; Pb; Self absorption; Total reflection; X ray absorption fine structure spectroscopy

Indexed keywords

CHEMICAL ANALYSIS; FLUORESCENCE; MICROMETERS; PROBLEM SOLVING; SYNCHROTRON RADIATION;

TOTAL REFLECTION X-RAY ANALYSIS (TXRF); TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF); X-RAY ABSORPTION FINE STRUCTURE (XAFS);

X RAY SPECTROSCOPY;

EID: 0346960897     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2003.06.006     Document Type: Conference Paper

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