Ultimate resolution in the electron microscope?

Materials Today

Volumn 11, Issue SUPPL., 2008, Pages 30-38

  Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL ANALYSIS; NANOSCIENCE;

ATOMIC CONFIGURATION; ATOMIC SCALE IMAGING; GROWTH AND SYNTHESIS; INDISPENSABLE TOOLS; INTRINSIC CAPACITY; MATERIALS SCIENTIST; NANOSCIENCE AND NANOTECHNOLOGIES; PHYSICAL BEHAVIORS;

ELECTRON MICROSCOPES;

EID: 58249143397     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(09)70005-7     Document Type: Review

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