HRTEM imaging of atoms at sub-Ångström resolution

Journal of Electron Microscopy

Volumn 54, Issue 3, 2005, Pages 169-180

  O'Keefe, Michael A ^a   Allard, Lawrence F ^b   Blom, Douglas A ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Atomic resolution; Exit surface wave; Focal series reconstruction; High resolution electron microscopy; Software aberration correction; Sub ngstr m

Indexed keywords

ABERRATIONS; CRYSTAL ATOMIC STRUCTURE; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LITHIUM BATTERIES; SURFACE WAVES;

ABERRATION CORRECTION; ANGSTROM RESOLUTION; ARIZONA STATE UNIVERSITY; ATOMIC-RESOLUTION; CRYSTAL UNIT CELL; EXIT-SURFACE WAVE; FOCAL SERIES RECONSTRUCTION; HIGH-RESOLUTION IMAGING; SOFTWARE ABERRATION CORRECTION; SUB-ANGSTROM;

ATOMS;

EID: 27744600371     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi036     Document Type: Article

References (59)

1. Strutt J W (Lord Rayleigh) (1874) On the manufacture and theory of diffraction gratings. Philos. Mag. 47: 81-93.
2. den Dekker A J and van den Bos A (1997) Resolution: a survey. J. Optical Soc. Am. A 14: 547-557.
3. Allpress J G (1969) The direct observation of structural features and defects in complex oxides by two-dimensional lattice imaging. Mat. Res. Bull. 310: 707-712.
4. Iijima S (1971) High-resolution electron microscopy of crystal lattice of titanium-niobium oxide. J. Appl. Phys. 42: 5891-5893.
5. Cook J M, O'Keefe M A, Smith D J, and Stobbs W M (1983) The high resolution electron microscopy of stacking defects in Cu-Zn-Al shape-memory alloy. J. Microsc. 129: 295-306.
6. Epicier T, O'Keefe M A, and Thomas G (1990) Atomic imaging of 3:2 mullite. Acta Crystallogr. A 46: 948-962.
7. 77. Acta Crystallogr. A 28: 528-535.
8. Lynch D F and O'Keefe M A (1972) n-beam lattice images, II. Methods of calculation. Acta Crystallogr. A 28: 536-548.
9. 77. Acta Crystallogr. A 29: 138-147.
10. O'Keefe M A (1973) n-beam lattice images, IV. Computed two-dimensional images. Acta Crystallogr. A 29: 389-401.
11. Lynch D F, Moodie A F, and O'Keefe M A (1975) n-beam lattice images, V. Use of the charge-density approximation in the interpretation of lattice images. Acta Crystallogr. A 31: 300-307.
12. O'Keefe M A and Sanders J V (1975) n-beam lattice images, VI. Degradation of image resolution by a combination of incident-beam divergence and spherical aberration. Acta Crystallogr. A 31: 307-310.
13. O'Keefe M A, Buseck P R, and Iijima S (1978) Computed crystal structure images for high-resolution electron microscopy. Nature 274: 322-324.
14. O'Keefe M A and Buseck P R (1979) Computation of high-resolution TEM images of minerals. Trans. ACA 15: 27-46.
15. Scherzer O (1949) The theoretical resolution limit of the electron microscope. J. Appl. Phy. 20: 20-29.
16. Schiske P (1973) Image Processing And Computer-Aided Design, ed. Hawkes P W, pp. 82-90 (Academic Press, London).
17. Van Dyck D and Op de Beeck M. (1990) New direct methods for phase and structure retrieval in HREM. In: Proceedings of the 12th International Congress for Electron Microscopy, ed. Peachy L D and Williams D B, pp. 26-27 (San Francisco Press, San Francisco, CA).
18. Lichte H (1991) Optimum focus for taking electron holograms. Ultramicroscopy 38: 13-22.
19. Haider M, Braunshausen G, and Schwan E (1995) Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector. Optik 99: 167-179.
20. Cowley J M and Iijima S (1972) Electron microscope image contrast for thin crystals. Z. Naturforsch. 27a: 445-451.
21. O'Keefe M A (1992) "Resolution" in high-resolution electron microscopy. Ultramicroscopy 47: 282-297.
22. O'Keefe M A (1979) Resolution-damping functions in non-linear images. In: 37th Annual Proceedings of the EMSA, ed. Bailey G W, pp. 556-557 (Claitor's Publishing Division, Baton Rouge).
23. Cowley J M and Moodie A F (1957) The scattering of electrons by atoms and crystals. I. A new theoretical approach. Acta Crystallogr. 10: 609-623.
24. Frank J (1973) The envelope of electron microscopic transfer functions for partially coherent illumination. Optik 38: 519-536.
25. Wade R H and Frank J (1977) Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread. Optik 49: 81-92.
26. O'Keefe M A, Tiemeijer P C, and Sidorov M V (2002) Estimation of the electron beam energy spread for TEM information limit. Microsc. Microanal. 8: 480-481.
27. Malm J-O and O'Keefe M A (1993) Using convergence and spread-of-focus parameters to model spatial and temporal coherence in HRTEM image simulations. In: 51st Annual Proceeding of the MSA, ed. Bailey G W and Rieder C L, pp. 974-975 (San Francisco Press, San Francisco, CA).
28. Coene W M J, Thust A, Op de Beeck M, and Van Dyck D (1996) Maximum-likelihood method for focus-variation image reconstruction in high-resolution transmission electron microscopy. Ultramicroscopy 64: 109-135.
29. Thust A, Coene W M J, Op de Beeck M, and Van Dyck D (1996) Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy 64: 211-230.
30. Thust A, Overwijk M, Coene W, and Lentzen M (1996) Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64: 249-260.
31. Thust A, Overwijk M, Jia C L, and Urban K (2003) Direct determination of imaging parameters from wave functions in HRTEM. Microsc. Microanal. 9(Suppl. 2): 140-142.
32. O'Keefe M A (2004) Image formation in the high-resolution transmission electron microscope. Microsc. Microanal. 10: 397-399.
33. O'Keefe M A, Hetherington C J D, Wang Y C, Nelson E C, Turner J H, Kisielowski C, Malm J-O, Mueller R, Ringnalda J, Pan M, and Thust A (2001) Sub-Ångström high-resolution transmission electron microscopy at 300 keV. Ultramicroscopy 89: 215-241.
34. Cowley J M and Moodie A F (1957) Fourier images. I. The point source. Proc. Phys. Soc. B 70: 486-496.
35. Iijima S and O'Keefe M A (1979) Determination of defocus values using 'Fourier images' for high-resolution electron microscopy. J. Microsc. 117: 347-354.
36. O'Keefe M A, Dahmen U, and Hetherington C J D (1989) Simulated image maps for use in Experimental high-resolution electron microscopy. Mat. Res. Soc. Symp. Proc. 159: 453-458.
37. O'Keefe M A and Allard L F (2004) A standard for sub-Ångström metrology of resolution in aberration-corrected transmission electron microscopes. Microsc. Microanal. 10: 1002-1003.
38. Van Dyck D, Van Aert S, and den Dekker A J (2004) Physical limits on atomic resolution. Microsc. Microanal. 10: 153-157.
39. Zuo J M, Blaha P, and Schwarz K (1997) The theoretical charge density of silicon: experimental testing of exchange and correlation potentials. J. Phys. Condens. Matter 9: 7541-7561.
40. O'Keefe M A and Radmilovic V (1993) The effects of small crystal tilts on dynamical scattering: why simulated images are thinner than experimental ones. In: 51st Annual Proceedings of the MSA, ed. Bailey G W and Rieder C L, pp. 980-981 (San Francisco Press, San Francisco, CA).
41. O'Keefe M A and Radmilovic V (1994) Specimen thickness is wrong in simulated HRTEM images. In: Proceedings of the XIIIth International Congress for Electron Microscopy ed. Jouffrey B and Colliex C, 1, pp. 361-362 (Les Editions de Physique, Les Ulis, France).
42. Allard L F, Blom D A, O'Keefe M A, Kiely C, Ackland D, Watanabe M, Kawasaki M, Kaneyama T, and Sawada H (2004) First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM. Microsc. Microanaly. 10: 110-111.
43. O'Keefe M A (1993) Using coherent illumination to extend HRTEM resolution: why we need a FEG-TEM for HREM. In: Proceedings of the LBL Symposium on Microstructures of Materials, ed. Krishnan K, pp. 121-126 (San Francisco Press, San Francisco, CA).
44. Bakker H, Bleeker A, and Mul P (1996) Design and performance of an ultra-high-resolution 300 kV microscope. Ultramicroscopy 64: 17-34.
45. O'Keefe M A (2001) Alpha-null defocus: an optimum defocus condition with relevance for focal-series reconstruction. Microsc. Microanal. 7: 916-917.
46. Typke D and Dierksen K (1995) Determination of image aberrations in high-resolution electron microscopy using diffractogram and cross-correlation methods. Optik 99: 155-166.
47. Wang Y C, Fitzgerald A, Nelson E C, Song C, O'Keefe M A, and Kisielowski C (1999) Effect of correction of the 3-fold astigmatism on HREM lattice imaging with information below 100 pm. Microsc. Microanal. 6: 822-823.
48. O'Keefe M A, Nelson E C, Wang Y C, and Thust A (2001) Sub-Ångström resolution of atomistic structures below 0.8 Å. Philos. Mag. B 81: 1861-1878.
49. Sparrow C M (1916) On spectroscopic resolving power. Astrophys. J. 44: 76-86.
50. O'Keefe M A, Allard L F, and Blom D A (2005) Resolution quality and atom positions in sub-Ångström electron microscopy. Microsc. Microanal. 11 (in press).
51. Downing K H, Meisheng Hu, Wenk H-R, and O'Keefe M A (1990) Resolution of oxygen atoms in staurolite by three-dimensional transmission electron microscopy. Nature 348: 525-528.
52. Wenk H-R, Downing K H, Meisheng Hu, and O'Keefe M A (1992) 3D structure determination from electron-microscope images: electron crystallography of staurolite. Acta Crystallogr. A 48: 700-716.
53. Horiuchi S, Matsui Y, Kitami Y, Yokoyama M, Suehara S, Wu X J, Matsui I, and Katsuta T (1991) Ultra-high-resolution HVEM (H-1500) newly constructed at NIRIM. II. Application to materials. Ultramicroscopy 39: 231-237.
54. 3 by means of phase-retrieval electron microscopy. Phys. Rev. Lett. 82: 5052-5055.
55. Jia C L, Lentzen M, and Urban K (2003) Atomic-resolution imaging of oxygen in perovskite ceramics. Science 299: 870-873.
56. Kisielowski C, Hetherington C J D, Wang Y C, Kilaas R, O'Keefe M A, and Thust A (2001) Imaging columns of the light elements carbon, nitrogen and oxygen at sub-Ångström resolution. Ultramicroscopy 89: 243-263.
57. 2. Nat. Mater. 2: 464-467.
58. O'Keefe M A and Shao-Horn Y (2004) Sub-Ångström atomic-resolution imaging from heavy atoms to light atoms. Microsc. Microanal. 10: 86-95.
59. Nellist P D, Chisholm M F, Dellby N, Krivanek O L, Murfitt M F, Szilagyi Z S, Lupini A R, Borisevich A, Sides W H Jr, and Pennycook S J (2004) Direct sub-angstrom imaging of a crystal lattice. Science 305: 1741.