Numerical correction of lens aberrations in phase-retrieval HRTEM

Ultramicroscopy

Volumn 64, Issue 1-4, 1996, Pages 249-264

  Thust, A ^a   Overwijk, M H F ^a   Coene, W M J ^a   Lentzen, M ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; FOCUSING; HOLOGRAPHY; IMAGE RECONSTRUCTION;

NUMERICAL CORRECTION; PHASE-RETRIEVAL HRTEM;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; HOLOGRAPHY; IMAGE RECONSTRUCTION;

EID: 0030221588     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00022-8     Document Type: Article

References (22)

1. [1] C.J. Humphreys and J.C.H. Spence, Optik 58 (2) (1981) 125.
2. [2] P.M. Mul, B.J.H. Bormans and M.T. Otten, Philips Electron Opt. Bull. 130 (1991) 53.
3. [3] H. Lichte, Ultramicroscopy 38 (1991) 13.
4. [4] W. Coene and A.J.E.M. Jansen, Scanning Microsc. Suppl. 6 (1992) 379.
5. [5] W.M.J. Coene, A. Thust, M. Op de Beeck and D. Van Dyck, Ultramicroscopy 64 (1996) 109 (this volume).
6. [6] A. Thust, W.M.J. Coene, M. Op de Beeck and D. Van Dyck, Ultramicroscopy 64 (1996) 211 (this volume).
7. [7] H. Lichte, Ultramicroscopy 20 (1986) 293.
8. [8] A. Orchowski, W.-D. Rau and H. Lichte, in: Proc. 13th Int. Congr. for Electron Microscopy, Paris, Vol. 1 (Les Editions de Physique, Les Ulis, 1994) p. 297.
9. [9] F. Zemlin, K. Weiss, P. Schiske, W. Kunath and K.-H. Herrmann. Ultramicroscopy 3 (1978) 49.
10. [10] K. Ishizuka, Ultramicroscopy 55 (1994) 407.
11. [11] O.L. Krivanek, Ultramicroscopy 55 (1994) 419.
12. [12] W.O. Saxton, Ultramicroscopy 58 (1995) 239.
13. [13] O.L. Krivanek and P.A. Stadelmann, Ultramicroscopy 60 (1995) 103.
14. [14] J.W. Goodman, Introduction to Fourier Optics (McGraw-Hill. New York, 1968).
15. [15] O.L. Krivanek and G.Y. Fan, Scanning Microsc. Suppl. 6 (1992) 105.
16. [16] Tietz Video and Image Processing Systems GmbH, Herbststrasse 7, D-82131 Gauting, Germany.
17. [17] W. Coene and D. Van Dyck, Ultramicroscopy 15 (1984) 29.
18. [18] M. Lentzen, D. Gerthsen, A. Förster and K. Urban, in: Proc. Microsc. Semicond. Mater, Conf., Oxford, 1995, to be published in Inst. Phys. Conf. Ser.
19. [19] D. Van Dyck, J. Danckaert, W. Coene, E. Selderslaghs, D. Broddin, J. Van Landuyt and S. Amelinckx, in: Computer Simulation of Electron Microscope Diffraction and Images, Eds. W. Krakow and M. O'Keefe (The Minerals, Metals and Materials Society, Warrendale, PA, 1989) p. 107.
20. [20] M. Op de Beeck, PhD Thesis, University of Antwerp, 1994.
21. [21] J.P. Hirth and J. Lothe, Theory of Dislocations (Wiley, New York, 1982).
22. [22] K. Ishizuka, Ultramicroscopy 5 (1980) 55.