High resolution TEM at 80kV acceleration voltage - Is approaching 1 Ångström possible?

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1470-1471

  Kujawa, S ^a   Erni, R ^a   Freitag, B ^a   Tiemeijer, P ^a   Stekelenburg, M ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750869246     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606572X     Document Type: Conference Paper

References (5)

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2. V.E. Cosslett in Electron Microscopy and Analysis 1979 (T. Mulvey, Institute of Physics, London 1979), p. 177
3. M. Haider et al, Ultramicroscopy 75 (1998) 53
4. S. Kujawa et al, Microsc. Today 13 no.4 (2005) 16
5. M. Lentzen et. Al. Ultromicroscopy 92 (2002), 233