Local measurement and computational refinement of aberrations for HRTEM

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 461-468

  Kirkland, Angus I ^a   Meyer, Rüdiger R ^a   Chang, Lan Yun Shery ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration measurement; High resolution electron microscopy

Indexed keywords

EID: 33947504493     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060612     Document Type: Conference Paper

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