Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy

Microscopy and Microanalysis

Volumn 14, Issue 1, 2008, Pages 16-26

  Lentzen, Markus ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberration correction; Contrast theory; High resolution electron microscopy; Optimum imaging; Resolution limit

Indexed keywords

EID: 38349187314     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080045     Document Type: Conference Paper

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