Atomic-scale imaging of asymmetric Lomer dislocation cores at the Ge/Si(001) heterointerface

Applied Physics Letters

Volumn 84, Issue 14, 2004, Pages 2530-2532

  Stirman, J N ^a   Crozier, P A ^a   Smith, David J ^a   Phillipp, F ^b   Brill, G ^c,d   Sivananthan, S ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^d U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE IMAGING; GROWTH TEMPERATURE; HETEROINTERFACE; LOMER DISLOCATION CORES;

ANISOTROPY; COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); ELECTRON MICROSCOPES; EPITAXIAL GROWTH; FREE ENERGY; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); SEMICONDUCTOR QUANTUM DOTS; SILICON; STRAIN; STRESS ANALYSIS;

GERMANIUM;

EID: 2342446493     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1697625     Document Type: Article

References (15)

1. K. Brunner, Rep. Prog. Phys. 65, 27 (2002).
2. J. Drucker, IEEE J. Quantum Electron. 38, 975 (2003).
3. G. Brill, D. J. Smith, D. Chandrasekhar, Y. Gogotsi, A. Prociuk, and S. Sivananthan, J. Cryst. Growth 201, 538 (1999).
4. F. K. LeGoues, M. Copel, and R. M. Tromp, Phys. Rev. B 42, 11690 (1990).
5. A. F. Schwartzman and R. Sinclair, J. Electron. Mater. 20, 805 (1991).
6. R. Hull, in Germanium Silicon; Physics and Materials I, edited by R. Hull and J. C. Bean (Academic, San Diego, 1999), Chap. 3.
7. A. Bourret, J. Desseaux, and A. Renault, Philos. Mag. A 45, 1 (1982).
8. J. Hornstra, Phys. Chem. Solids 5, 129 (1958).
9. A. S. Nandedkar and J. Narayan, Mater. Sci. Eng., A 113, 51 (1989)
10. M. Dornheim and H. Teichler, Phys. Status Solidi A 171, 267 (1999).
11. A. Vila, A. Cornet, J. R. Morante, P. Ruterana, M. Loubradou, R. Bonnet, Y. Gonzalez, and L. Gonzalez, Philos. Mag. A 71, 85 (1995).
12. E Phillipp, R. Hs̈chen, M. Osaki, G. Möbus, and M. Rühle, Ultramicros-copy 56, 1 (1995).
13. M. Floyd, Y. Zhang, K. P. Driver, J. Drucker, P. A. Crozier, and D. J. Smith, Appl. Phys. Lett. 82, 1473 (2003).
14. J. N. Stirman, F. A. Ponce, A. Pavlovska, I. S. T. Tsong, and D. J. Smith, Appl. Phys. Lett. 76, 822 (2000).
15. S. J. Pennycook, D. E. Jesson, A. J. McGibbon, and P. D. Nellist, J. Electron Microsc. 47, 561 (1996).