Electron holography: Phase imaging with nanometer resolution

Annual Review of Materials Research

Volumn 37, Issue , 2007, Pages 729-767

  McCartney, Martha R ^a   Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Charged defects; Dopant profile; Electrostatic fields; Magnetic fields; Magnetization reversal; Off axis electron holography; Patterned nanostructures; Piezoelectric fields; Remanent state

Indexed keywords

CRYSTAL DEFECTS; ELECTROSTATICS; FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; MAGNETIC FIELDS; MAGNETIZATION REVERSAL; PHASE SHIFT;

DOPANT PROFILE; OFF-AXIS ELECTRON HOLOGRAPHY; PATTERNED NANOSTRUCTURES; PIEZOELECTRIC FIELDS; REMANENT STATE;

ELECTRON HOLOGRAPHY;

EID: 34848890616     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.37.052506.084219     Document Type: Review

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