Electron detection characteristics of slow-scan CCD camera

Ultramicroscopy

Volumn 66, Issue 1-2, 1996, Pages 21-33

  Zuo, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRONS; QUANTUM EFFICIENCY; SINGLE CRYSTALS;

MODULATION TRANSFER FUNCTION (MTF); SLOW SCAN CAMERAS (SSC);

CAMERAS;

ARTICLE; CAMERA; ELECTRON MICROSCOPY; IMAGE PROCESSING;

EID: 0030291911     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00075-7     Document Type: Article

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