Differential phase contrast in TEM

Ultramicroscopy

Volumn 65, Issue 3-4, 1996, Pages 179-186

  McCartney, M R ^a   Kruit, P ^b   Buist, A H ^b   Scheinfein, M R ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; FIELD EMISSION MICROSCOPES; HOLOGRAPHY; IMAGING TECHNIQUES; MAGNETIC DOMAINS; MAGNETIC MATERIALS; MAGNETIZATION;

DIFFERENTIAL PHASE CONTRAST; DOMAIN WALL POSITION; ELECTROSTATIC BIPRISM; FRESNEL IMAGING;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; HOLOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030272474     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00068-X     Document Type: Article

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