Quantitative measurement of grain boundary potentials on the nanoscale by off-axis electron holography

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 22, 2003, Pages

  Schofield, M A ^a   Wu, L ^a   Zhu, Y ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; CALCIUM; COPPER COMPLEX; METAL OXIDE; STRONTIUM;

ARTICLE; ELECTRON; HOLOGRAPHY; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS; MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0041743758     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.224512     Document Type: Article

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