Quantitative magnetometry using electron holography: field profiles near magnetic force microscope tips

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 1, 1996, Pages 4124-4129

  Streblecheuko, Dmitry G ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOLOGRAPHY; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIZATION; MICROSCOPES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; SCANNING;

ELECTROMAGNETIC POTENTIALS; ELECTRON HOLOGRAPHY; ELECTRON WAVEFUNCTION; ELECTROSTATIC BIPRISM; MAGNETIC FORCE MICROSCOPE; MAGNETIC FORCE MICROSCOPY; MAGNETIC MICROSTRUCTURE; QUANTITATIVE MAGNETOMETRY; SCANNING TRANSMISSION ELECTRON MICROSCOPE;

MAGNETOMETERS;

EID: 0030244996     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.539316     Document Type: Article

References (8)

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