-
3
-
-
3743048582
-
-
K. Barmak, R. A. Ristau, K. R. Coffey, M. A. Parker, and J. K. Howard, J. Appl. Phys. 79, 5967 (1996).
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 5967
-
-
Barmak, K.1
Ristau, R.A.2
Coffey, K.R.3
Parker, M.A.4
Howard, J.K.5
-
4
-
-
0029309762
-
-
R. F. C. Farrow, R. F. Marks, A. Cebollada, G. R. Harp, T. A. Rabedeau, M. F. Toney, D. Weller, and S. S. P. Parkin, J. Cryst. Growth 150, 1126 (1995).
-
(1995)
J. Cryst. Growth
, vol.150
, pp. 1126
-
-
Farrow, R.F.C.1
Marks, R.F.2
Cebollada, A.3
Harp, G.R.4
Rabedeau, T.A.5
Toney, M.F.6
Weller, D.7
Parkin, S.S.P.8
-
5
-
-
3743071013
-
-
R. F. C. Farrow, D. Weller, R. F. Marks, M. F. Toney, A. Cebollada, and G. R. Harp, J. Appl. Phys. 79, 5330 (1996).
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 5330
-
-
Farrow, R.F.C.1
Weller, D.2
Marks, R.F.3
Toney, M.F.4
Cebollada, A.5
Harp, G.R.6
-
6
-
-
0039117565
-
-
edited by E. Ruedl and U. Valdre Commission of European Communities, Brussels
-
J. P. Jakubovics, in Electron Microscopy in Materials Science, edited by E. Ruedl and U. Valdre (Commission of European Communities, Brussels, 1975), p. 1303.
-
(1975)
Electron Microscopy in Materials Science
, pp. 1303
-
-
Jakubovics, J.P.1
-
8
-
-
0001675679
-
-
G. A. Bertero, R. Sinclair, C.-H. Park, and Z. X. Chen, J. Appl. Phys. 77, 3953 (1995).
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 3953
-
-
Bertero, G.A.1
Sinclair, R.2
Park, C.-H.3
Chen, Z.X.4
-
9
-
-
0011819332
-
-
J. N. Chapman, R. P. Ferrier, L. J. Heyderman, W. A. P. Nicholson, and B. Bormans, Inst. Phys. Conf. Ser. 138, 1 (1993).
-
(1993)
Inst. Phys. Conf. Ser.
, vol.138
, pp. 1
-
-
Chapman, J.N.1
Ferrier, R.P.2
Heyderman, L.J.3
Nicholson, W.A.P.4
Bormans, B.5
-
10
-
-
0030272474
-
-
M. R. McCartney, P. Kruit, A. H. Buist, and M. R. Scheinfein, Ultramicroscopy 65, 179 (1996).
-
(1996)
Ultramicroscopy
, vol.65
, pp. 179
-
-
McCartney, M.R.1
Kruit, P.2
Buist, A.H.3
Scheinfein, M.R.4
-
13
-
-
0345129763
-
-
A. Tonomura, T. Matsuda, J. Endo, T. Arii, and K. Mihama, Appl. Phys. Lett. 42, 746 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.42
, pp. 746
-
-
Tonomura, A.1
Matsuda, T.2
Endo, J.3
Arii, T.4
Mihama, K.5
-
14
-
-
0008084912
-
-
N. Osakabe, K. Yoshida, Y. Horiuchi, T. Matsuda, H. Tanaka, T. Okuwaki, J. Endo, H. Fujiwara, and A. Tonomura, Appl. Phys. Lett. 42, 746 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.42
, pp. 746
-
-
Osakabe, N.1
Yoshida, K.2
Horiuchi, Y.3
Matsuda, T.4
Tanaka, H.5
Okuwaki, T.6
Endo, J.7
Fujiwara, H.8
Tonomura, A.9
-
16
-
-
0027640388
-
-
J. K. Weiss, H. de Ruijter, M. Gajdardziska-Josifovska, M. R. McCartney, and D. J. Smith, Ultramicroscopy 50, 301 (1993).
-
(1993)
Ultramicroscopy
, vol.50
, pp. 301
-
-
Weiss, J.K.1
De Ruijter, H.2
Gajdardziska-Josifovska, M.3
McCartney, M.R.4
Smith, D.J.5
-
18
-
-
0003641364
-
-
edited by A. Tonomura et al. Springer, Berlin
-
M. Mankos, P. de Haan, V. Kambersky, G. Matteucci, M. R. McCartney, Z. Yang, M. R. Scheinfein, and J. M. Cowley, in Electron Holography, edited by A. Tonomura et al. (Springer, Berlin, 1995), p. 329.
-
(1995)
Electron Holography
, pp. 329
-
-
Mankos, M.1
De Haan, P.2
Kambersky, V.3
Matteucci, G.4
McCartney, M.R.5
Yang, Z.6
Scheinfein, M.R.7
Cowley, J.M.8
-
19
-
-
3743066566
-
-
D. J. Smith, Z. G. Li, A. R. Modak, S. S. P. Parkin, R. F. C. Farrow, and R. F. Marks, Scr. Metall. Mater. 30, 690 (1994).
-
(1994)
Scr. Metall. Mater.
, vol.30
, pp. 690
-
-
Smith, D.J.1
Li, Z.G.2
Modak, A.R.3
Parkin, S.S.P.4
Farrow, R.F.C.5
Marks, R.F.6
-
20
-
-
0001987328
-
-
edited by A. Tonomura et al. Springer, Berlin
-
M. Lehmann and H. Lichte, in Electron Holography, edited by A. Tonomura et al. (Springer, Berlin. 1995), p. 69.
-
(1995)
Electron Holography
, pp. 69
-
-
Lehmann, M.1
Lichte, H.2
|