Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions

Journal of Applied Physics

Volumn 82, Issue 2, 1997, Pages 522-527

  Hirayama, Tsukasa ^a   Lai, Guanming ^b   Tanji, Takayoshi ^c   Tanaka, Nobuo ^c   Tonomura, Akira ^d  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC VARIABLES MEASUREMENT; ELECTROMAGNETIC FIELDS; FREQUENCY MODULATION; HOLOGRAPHY; MAGNETIC FIELDS; PHASE SHIFT; PRISMS; TRANSMISSION ELECTRON MICROSCOPY; VISUALIZATION;

BIPRISMS; ELECTROMAGNETIC MICROFIELDS; ELECTRON BEAM IRRADIATION; MAGNETIC FLUX; PERIODIC INTERFERENCE FRINGES; THREE ELECTRON WAVES;

ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 0031193020     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365610     Document Type: Article

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