Towards quantitative electron holography of magnetic thin films using in situ magnetization reversal

Ultramicroscopy

Volumn 74, Issue 1-2, 1998, Pages 61-73

  Dunin Borkowski, R E ^a   McCartney, M R ^a   Smith, David J ^a   Parkin, S S P ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

In situ magnetization reversal; Magnetic thin films; Off axis electron halography

Indexed keywords

HOLOGRAPHY; MAGNETIC THIN FILMS; MAGNETIZATION; SILICON NITRIDE; TUNNEL JUNCTIONS;

IN SITU MAGNETIZATION REVERSAL; OFF AXIS ELECTRON HOLOGRAPHY;

TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL ERROR; ARTICLE; HOLOGRAPHY; MAGNETIC FIELD; QUANTITATIVE ASSAY;

EID: 0032126283     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00023-0     Document Type: Article

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